Journal of Electronic Testing

, Volume 29, Issue 3, pp 275–288

A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

Article

DOI: 10.1007/s10836-013-5357-0

Cite this article as:
Shi, Y. & Dworak, J. J Electron Test (2013) 29: 275. doi:10.1007/s10836-013-5357-0

Abstract

When testing resources are severely limited, special attention should be paid to critical faults/defects so that important or frequent field failures arising from test escapes can be minimized. We present a new algorithm to optimize test sets aimed at significantly reducing the criticality of test escapes—especially for very short test sets that may be applied in the field. The algorithm proposes an exponential-based test set quality model to evaluate the criticality of potential undetected defects and develops a programming model to search for a test set that effectively reduces this criticality.

Keywords

Index Terms—fault criticality Test set optimization Field failure rate Probabilistic defect detection Field testing 

Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  1. 1.Oracle CorporationSanta ClaraUSA
  2. 2.Southern Methodist UniversityDallasUSA

Personalised recommendations