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Journal of Electronic Testing

, Volume 28, Issue 5, pp 641–651 | Cite as

Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator

  • Kazuyuki Wakabayashi
  • Keisuke Kato
  • Takafumi Yamada
  • Osamu Kobayashi
  • Haruo KobayashiEmail author
  • Fumitaka Abe
  • Kiichi Niitsu
Article

Abstract

This paper describes algorithms for generating a low-distortion single-tone signal, for testing ADCs, using an arbitrary waveform generator (AWG). The AWG consists of DSP (or waveform memory) and DAC, and the nonlinearity of the DAC generates distortion components. We propose here to use DSP algorithms to precompensate for the distortion. The DSP part of the AWG can interleave multiple signals with the same frequency but different phases at the input to the DAC, in order to precompensate for distortion caused by DAC nonlinearity. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of this approach.

Keywords

ADC testing Arbitrary waveform generator Digital pre-distortion Sinusoidal signal Distortion shaping 

Notes

Acknowledgments

We would like to thank T. Matsuura, N. Takai, Y. Yano, T. Gake, T. J. Yamaguchi, H. Miyashita, S. Kishigami, K. Rikino, S. Uemori and K. Wilkinson for valuable discussions.

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Copyright information

© Springer Science+Business Media, LLC 2012

Authors and Affiliations

  • Kazuyuki Wakabayashi
    • 1
  • Keisuke Kato
    • 1
  • Takafumi Yamada
    • 1
  • Osamu Kobayashi
    • 2
  • Haruo Kobayashi
    • 1
    Email author
  • Fumitaka Abe
    • 1
  • Kiichi Niitsu
    • 1
  1. 1.Electronic Engineering DepartmentGunma UniversityKiryu GunmaJapan
  2. 2.Semiconductor Technology Academic Research Center (STARC)YokohamaJapan

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