Journal of Electronic Testing

, Volume 28, Issue 5, pp 641–651 | Cite as

Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator

  • Kazuyuki Wakabayashi
  • Keisuke Kato
  • Takafumi Yamada
  • Osamu Kobayashi
  • Haruo KobayashiEmail author
  • Fumitaka Abe
  • Kiichi Niitsu


This paper describes algorithms for generating a low-distortion single-tone signal, for testing ADCs, using an arbitrary waveform generator (AWG). The AWG consists of DSP (or waveform memory) and DAC, and the nonlinearity of the DAC generates distortion components. We propose here to use DSP algorithms to precompensate for the distortion. The DSP part of the AWG can interleave multiple signals with the same frequency but different phases at the input to the DAC, in order to precompensate for distortion caused by DAC nonlinearity. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of this approach.


ADC testing Arbitrary waveform generator Digital pre-distortion Sinusoidal signal Distortion shaping 



We would like to thank T. Matsuura, N. Takai, Y. Yano, T. Gake, T. J. Yamaguchi, H. Miyashita, S. Kishigami, K. Rikino, S. Uemori and K. Wilkinson for valuable discussions.


  1. 1.
    Arabi K (2010) Mixed-signal test impact to SoC commercialization. In: IEEE VLSI test symposiumGoogle Scholar
  2. 2.
    Burns M, Roberts GW (2000) An introduction in mixed-signal IC test and measurement. Oxford Univ PressGoogle Scholar
  3. 3.
    Cheng K-T, Chang H-M (2010) Recent advances in analog, mixed-signal and RF testing. IPSJ trans on system LSI design methodology, vol 3, pp 19–46Google Scholar
  4. 4.
    Cripps SC (1999) RF power amplifier for wireless communications. Artec House, pp 263–267Google Scholar
  5. 5.
    Cripps SC (2002) Advanced techniques in RF power amplifier design. Artec House, pp 153–195Google Scholar
  6. 6.
    Kurosawa N, Kobayashi H, Maruyama K, Sugawara H, Kobayashi K (2001) Explicit analysis of channel mismatch effects in time-interleaved ADC systems. IEEE Trans Circuits Syst I 48(3):261–271CrossRefGoogle Scholar
  7. 7.
    Maeda A (2008) A method to generate a very low distortion, high frequency sine waveform using an AWG. In: IEEE international test conference, Santa Clara, CAGoogle Scholar
  8. 8.
    Maloberti F (2007) Data converters. SpringerGoogle Scholar
  9. 9.
    Plassche R (2003) CMOS integrated analog-to-digital and digital-to-analog converters, 2nd edn, Chapters 1, 4 and 6. Kluwer Academic Publishers, BostonzbMATHGoogle Scholar
  10. 10.
    Shrestha R, Mensink E, Klumperink EAM, Wienk GJM, Nauta B (2006) A multi-path technique canceling harmonics and sidebands in a wideband power upconverter. In: Tech digest of IEEE international solid-state circuits conference, San FranciscoGoogle Scholar
  11. 11.
    Uemori S, Yamaguchi TJ, Ito S, Tan Y, Kobayashi H, Takai N, Niitsu K, Ishikawa N (2010) ADC linearity test signal generation algorithm. In: IEEE Asia Pacific conference on circuits and systems, Kuala LumpurGoogle Scholar
  12. 12.
    Wakabayashi K, Yamada T, Uemori S, Kobayashi O, Kato K, Kobayashi H, Niitsu K, Miyashita H, Kishigami S, Rikino K, Yano Y, Gake T (2011) Low-distortion single-tone and two-tone sinewave generation algorithms using an arbitrary waveform generator. In: IEEE international mixed-signals, sensors and systems test workshop, Santa Barbara, CAGoogle Scholar
  13. 13.
    Yagi T, Kobayashi H, Tan Y, Ito S, Uemori S, Takai N, Yamaguchi TJ (2010) Production test consideration for mixed-signal IC with background calibration. IEEJ Trans on Electrical and Electronic Eng 5(6):651–659CrossRefGoogle Scholar
  14. 14.
    Yamada T, Kobayashi O, Kato K, Wakabayashi K, Kobayashi H, Matsuura T, Yano Y, Gake T, Niitsu K, Takai N, Yamaguchi TJ (2011) Low-distortion single-tone and two-tone sinewave generation using ΣΔ DAC. In: IEEE international test conference (poster session), Anaheim, CAGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2012

Authors and Affiliations

  • Kazuyuki Wakabayashi
    • 1
  • Keisuke Kato
    • 1
  • Takafumi Yamada
    • 1
  • Osamu Kobayashi
    • 2
  • Haruo Kobayashi
    • 1
    Email author
  • Fumitaka Abe
    • 1
  • Kiichi Niitsu
    • 1
  1. 1.Electronic Engineering DepartmentGunma UniversityKiryu GunmaJapan
  2. 2.Semiconductor Technology Academic Research Center (STARC)YokohamaJapan

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