Abstract
Aurivillius type five-layered V-doped Bi6Fe2(Ti3-xVx)O18+δ (x = 0.00, 0.03, 0.06, and 0.09) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by using a chemical solution deposition method. All the thin films were crystallized in Aurivillius structures, which have been confirmed by using X-ray diffraction and Raman spectroscopy studies. On comparing the thin films, the Bi6Fe2(Ti2.94V0.06)O18+δ thin film showed the most enhanced electrical and multiferroic properties, with a leakage current density value about four orders of magnitude lower than that of the Bi6Fe2Ti3O18 thin film, for example. All of these thin films showed anti-ferromagnetic hysteresis loops at room temperature. The significant decrease in the concentration of oxygen vacancies and the formation of a stable structure caused by doping with the donor V5+-ion are related to the improved properties in the V-doped Bi6Fe2(Ti3-xVx)O18+δ thin films.
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M. Krzhizhanovskaya, S. Filatov, V. Gusarov, P. Paufler, R. Bubnova, M. Morozov, D. C. Meyer, Z. Anorg, Allg. Chem. 631, 1603 (2005)
N. A. Lomanova, M. I. Morozov, V. L. Ugolkov, V. V. Gusarov, Inorg. Mater. 42, 189 (2006)
A. Srinivas, S. V. Suryanarayana, G. S. Kumar, M. Mahsh Kumar, J. Phys. Condens. Matter 11, 3335 (1999)
K. R. S. Preethi Meher, K. B. R. Varma, J. Appl. Phys. 106, 124103 (2009)
N. V. Prasad, G. S. Kumar, Mater. Sci. Eng. B 108, 194 (2004)
L. Keeney, P. F. Zhang, C. Groh, M. E. Pemble, R. W. Whatmore, J. Appl. Phys. 108, 042004 (2010)
H. Irie, M. Miyayama, T. Kudo, J. Appl. Phys. 90, 4089 (2001)
M. Miyayama, I.–. S. Yi, Ceram. Inter. 26, 529 (2000)
J.-B. Li, Y. P. Huang, G. H. Rao, G. Y. Liu, J. Luo, J. R. Chen, J. K. Liang, Appl. Phys. Lett. 96, 222903 (2010)
J. Yang, W. Tong, Z. Liu, X. B. Zhu, J. M. Dai, W. H. Song, Z. R. Yang, Y. P. Sun, Phys. Rev. B 86, 104410 (2012)
Z. Liu, J. Yang, X. W. Tang, L. H. Yin, X. B. Zhu, J. M. Dai, Y. P. Sun, Appl. Phys. Lett. 101, 122402 (2012)
H. Sun, J. Zhu, H. Fang, X. Chen, J. Appl. Phys. 100, 074102 (2006)
C. M. Raghavan, J. W. Kim, J.–. W. Kim, S. S. Kim, Ceram. Inter. 40, 10649 (2014)
S. Kojima, R. Imaizumi, S. Hamazaki, M. Takashige, Jpn. J. Appl. Phys. 33, 5559 (1994)
X. Mao, H. Sun, W. Wang, Y. Lu, X. Chen, Solid State Commun. 152, 483 (2012)
S.-T. Zhang, Y.-F. Chen, Z.-G. Liu, N.-B. Ming, J. Appl. Phys. 97, 104106 (2005)
W. Bai, W. F. Xu, J. Wu, J. Y. Zhu, G. Chen, J. Yang, T. Lin, X. J. Meng, X. D. Tang, J. H. Chu, Thin Solid Films 525, 195 (2012)
J. Wang, G. X. Cheng, S. T. Zhang, H. W. Cheng, Y. F. Chen, Physica B 344, 368 (2004)
M. Cazayous, D. Malka, D. Lebeugle, D. Colson, Appl. Phys. Lett. 91, 071910 (2007)
H. Du, L. Tang, S. Kaskel, J. Phys. Chem. C 113, 1329 (2009)
A. F. Shimanskij, M. Drofenik, D. J. Kolar, J. Mater. Sci. 29, 6301 (1994)
A. Z. Simões, R. F. Pianno, E. C. Aguiar, E. Longo, J. A. Varela, J. Alloy. Compd. 479, 274 (2009)
F. Huang, X. Lu, T. T. Xu, Y. Liu, W. Su, Y. Jin, Y. Kan, J. Zhu, Thin Solid Films 520, 6489 (2012)
I. J. Zhu, X.–. B. Chen, J. He, J.–. C. Shen, Phys. Lett. A 362, 471 (2007)
T. Kawae, Y. Terauchi, H. Tsuda, M. Kumeda, A. Morimoto, Appl. Phys. Lett. 94, 112904 (2009)
I. Coondoo, A. K. Jha, S. K. Agarwal, J. Eur. Ceram. Soc. 27, 253 (2007)
L. Keeney, T. Maity, M. Schmidt, A. Amann, N. Deepak, N. Petkov, S. Roy, M. E. Pemble, R. W. Whatmore, J. Am. Ceram. Soc. 96, 2339 (2013)
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This work was supported by the Priority Research Centers Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2010-0029634).
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Raghavan, C.M., Kim, J.W., Kim, S.S. et al. Structural, electrical, and multiferroic properties of Aurivillius Bi6Fe2(Ti3-xVx)O18+δ thin films prepared by chemical solution deposition. J Electroceram 36, 76–81 (2016). https://doi.org/10.1007/s10832-016-0031-4
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DOI: https://doi.org/10.1007/s10832-016-0031-4