Abstract
The structure and microwave dielectric properties of Sr1+x Sm1-x Al1-x Ti x O4 ceramics were determined in the entire composition range of x = 0 ~ 1.0. The single phase solid solutions with K2NiF4 structure were obtained, and the Q × f value decreased with increasing x at first (up to 0.15) and then turned to increase and reached the maximum at x = 0.9. The dielectric constant ε r increased from 19.2 to 36.5 and the temperature coefficient of resonant frequency τ f ascended monotonously with increasing x. The variation tendency of Q × f value with x reflected the competition result of the interlayer polarization and the structure inhomogeneity. On the other hand, infrared (IR) reflectivity spectra were measured and fitted by means of classical oscillator model simulation. The intrinsic dielectric loss tangent extrapolated from IR range showed a similar changing trend with the measured ones. Moreover, the fitting results offered a detail inside view of the intrinsic factors and the variation of the dielectric loss could be well explained.
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The present work was financially supported by Chinese National Basic Research Program under grant number 2009CB623302.
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Liu, B., Yi, L., Liu, X.Q. et al. Structure and microwave dielectric properties of SrSmAlO4-Sr2TiO4 solid solutions. J Electroceram 34, 114–121 (2015). https://doi.org/10.1007/s10832-014-9959-4
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DOI: https://doi.org/10.1007/s10832-014-9959-4