Skip to main content
Log in

Numerical Analysis of Coaxial Double Gate Schottky Barrier Carbon Nanotube Field Effect Transistors

  • Published:
Journal of Computational Electronics Aims and scope Submit manuscript

Abstract

Carbon nanotube field-effect transistors (CNTFETs) have been studied in recent years as a potential alternative to CMOS devices, because of the capability of ballistic transport. The ambipolar behavior of Schottky barrier CNTFETs limits the performance of these devices. A double gate design is proposed to suppress this behavior. In this structure the first gate located near the source contact controls carrier injection and the second gate located near the drain contact suppresses parasitic carrier injection. To avoid the ambipolar behavior it is necessary that the voltage of the second gate is higher or at least equal to the drain voltage. The behavior of these devices has been studied by solving the coupled Schrödinger-Poisson equation system. We investigated the effect of the second gate voltage on the performance of the device and finally the advantages and disadvantages of these options are discussed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. A. Javey et al., “Ballistic Carbon Nanotube Field-Effect Transistors,” Letters to Nature, 424(6949), 654 (2003).

    Google Scholar 

  2. R. Martel et al., “Ambipolar Electrical Transport in Semiconducting Single-Wall Carbon Nanotubes,” Physical Review Letters, 87, 256805 (2001).

    Article  PubMed  Google Scholar 

  3. J. Appenzeller et al., “Field-Modulated Carrier Transport in Carbon Nanotube Transistors,” Physical Review Letters, 89, 126801 (2002).

    Article  PubMed  Google Scholar 

  4. J. Appenzeller et al., “Field-Modulated Carrier Transport in Carbon Nanotube Transistors,” Physical Review Letters, 89, 106801 (2002).

    Article  PubMed  Google Scholar 

  5. J. Appenzeller et al., “Tunneling Versus Thermionic Emission in One-Dimensional Semiconductors,” Physical Review Letters, 92, 048301 (2004).

    Article  PubMed  Google Scholar 

  6. M. Radosavljevic et al., “Drain Voltage Scaling in Carbon Nanotube Transistors,” Appl. Phys. Lett., 83(12), 2435 (2003).

    Article  Google Scholar 

  7. J. Guo et al., “A Numerical Study of Scaling Issues for Schottky Barrier Carbon Nanotube Transistors,” IEEE Trans. Electron Devices, 51(2), 172 (2004).

    Article  Google Scholar 

  8. FETs, “IEEE Trans. Nanotechnology,” 2(3), 181 (2003).

    Google Scholar 

  9. M. Pourfath et al., “Improving the Ambipolar Behavior of Schottky Barrier Carbon Nanotube Field Effect Transistors,” in Proc. ESSDERC (2004), p. 429.

  10. D. John et al., “A Schrödinger-Poisson Solver for Modeling Carbon Nanotube FETs,” in Proc. NSTI Nanotech (2004), p. 65.

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Mahdi Pourfath.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Pourfath, M., Ungersboeck, E., Gehring, A. et al. Numerical Analysis of Coaxial Double Gate Schottky Barrier Carbon Nanotube Field Effect Transistors. J Comput Electron 4, 75–78 (2005). https://doi.org/10.1007/s10825-005-7111-z

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10825-005-7111-z

Keywords

Navigation