Abstract
A mixed finite element scheme is used to simulate a consistent energy-transport model for electron transport in semiconductor devices, free of any fitting parameters, formulated on the basis of the maximum entropy principle.
Simulations of silicon n+-n-n+ diodes, 2D-MESFET and 2D-MOSFET and comparisons with the results obtained with Monte Carlo direct simulation and with other energy-transport models, known in literature, show the validity of the model and the robustness of the numerical scheme.
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Anile, A.M., Marrocco, A., Romano, V. et al. 2D Numerical Simulation of the MEP Energy-Transport Model with a Mixed Finite Elements Scheme. J Comput Electron 4, 231–259 (2005). https://doi.org/10.1007/s10825-005-5039-y
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DOI: https://doi.org/10.1007/s10825-005-5039-y