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Algorithm for Second-Order Diffraction Correction in a Concave Diffraction Grating Spectrometer

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Journal of Applied Spectroscopy Aims and scope

A feature of diffraction grating spectrometers in the visible and near IR range is that the second-order diffraction spectrum overlaps the first-order diffraction spectrum. This leads to distortions of the recorded spectrum in its long-wavelength region. We propose a method for correction of the second-order diffraction, based on representing the spectrum as the sum of Gaussians with parameters that are experimentally determined for individual wavelengths, followed by numerical interpolation. We also use parametrization of the second-order line shape. We describe the details of the experiment required, and test the performance of the method using an SSP-600N spectrometer as an example.

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Authors and Affiliations

  1. A. N. Sevchenko Institute of Applied Physical Problems, Belarusian State University, 7 Kurchatov Str., Minsk, 220108, Belarus

    S. I. Bruchkouskaya, G. S. Litvinovich, I. I. Bruchkousky & L. V. Katkovsky

Authors
  1. S. I. Bruchkouskaya
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  2. G. S. Litvinovich
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  3. I. I. Bruchkousky
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  4. L. V. Katkovsky
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Corresponding author

Correspondence to S. I. Bruchkouskaya.

Additional information

Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 86, No. 4, pp. 620–626, July–August 2019.

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Bruchkouskaya, S.I., Litvinovich, G.S., Bruchkousky, I.I. et al. Algorithm for Second-Order Diffraction Correction in a Concave Diffraction Grating Spectrometer. J Appl Spectrosc 86, 671–677 (2019). https://doi.org/10.1007/s10812-019-00877-3

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  • DOI: https://doi.org/10.1007/s10812-019-00877-3

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