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Test Station for Frequency-Domain Dielectric Spectroscopy of Nanocomposites and Semiconductors

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Journal of Applied Spectroscopy Aims and scope

An upgraded test station is described for determining the electrophysical properties of materials by frequency-domain dielectric spectroscopy. As a result of the upgrade, the range of measurable temperatures is expanded (the full range of measurable temperatures is 10–450 K) and also better accuracy of the measurement and temperature control is achieved. The test station is controlled using a new special computer program. The upgraded test station makes it possible to simultaneously study two samples in the a.c. frequency range from 50 Hz to 5 MHz. Results of studies of the electrical properties (resistance Rp, capacitance Cp, phase shift angle θ, and dielectric loss tangent or dissipation factor tan δ) are presented for the metal–dielectric nanocomposite (FeCoZr)x(CaF2)(100–x).

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Authors and Affiliations

  1. Lublin University of Technology, 38a Nadbystrzycka Str., Lublin, 20-618, Poland

    T. N. Koltunowicz

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  1. T. N. Koltunowicz
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Correspondence to T. N. Koltunowicz.

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 82, No. 4, pp. 616–621, July–August, 2015.

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Koltunowicz, T.N. Test Station for Frequency-Domain Dielectric Spectroscopy of Nanocomposites and Semiconductors. J Appl Spectrosc 82, 653–658 (2015). https://doi.org/10.1007/s10812-015-0158-0

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  • DOI: https://doi.org/10.1007/s10812-015-0158-0

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