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Nuclear Microscopy for Air-Pollutant Characterization and Its Advantages over Traditional Techniques

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Journal of Applied Spectroscopy Aims and scope

In the present study we establish the use of the proton induced X-ray emission (PIXE) technique coupled with Rutherford backscattering as a sensitive technique for air-pollution monitoring. Several elements such as Al, Si, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, and As were detected in the ppm level of concentration. Comparisons show the advantages of micro-PIXE over scanning microscope-based energy-dispersive X-ray spectrometry (SEM-EDX) and energy-dispersive X-ray fluorescence spectrometry (EDXRF).

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Authors and Affiliations

  1. UGC-DAE Consortium for Scientific Research, LB-8, Salt Lake-3, Kolkata, 700098, India

    S. S. Ram, M. Sudarshan & A. Chakraborty

  2. University of Cambridge, Cambridge, UK

    S. S. Ram & R. V. Kumar

  3. University of Calcutta, Kolkata, India

    S. S. Ram & P. Chaudhuri

  4. Allergy & Asthma Research Centre, Kolkata, India

    S. Chanda

  5. University of Kalyani, Nadia, India

    S. C. Santra

  6. School of the Built and Natural Environment, Northumbria University, Newcastle upon Tyne, UK

    M. Deary

Authors
  1. S. S. Ram
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  2. R. V. Kumar
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  3. P. Chaudhuri
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  4. S. Chanda
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  5. S. C. Santra
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  6. M. Deary
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  7. M. Sudarshan
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  8. A. Chakraborty
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Correspondence to S. S. Ram.

Additional information

Published in Zhurnal Prikladnoi Spektroskopii, Vol. 81, No. 1, pp. 146–149, January–February, 2014.

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Ram, S.S., Kumar, R.V., Chaudhuri, P. et al. Nuclear Microscopy for Air-Pollutant Characterization and Its Advantages over Traditional Techniques. J Appl Spectrosc 81, 145–150 (2014). https://doi.org/10.1007/s10812-014-9900-2

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  • DOI: https://doi.org/10.1007/s10812-014-9900-2

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