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Measurement of the Width of Emission Spectra by a Waveguide Technique

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Journal of Applied Spectroscopy Aims and scope

An Erratum to this article was published on 26 January 2017

The dependence of the spatial distribution of the recorded m-line intensity on the frequency characteristics of a light beam is studied for excitation of waveguide modes in thin-film structures. Semiconductor diodes with emission peaks at 635–670 nm, an He–Ne laser, and light from an incandescent lamp passed through a monochromator are used as light sources with different spectral widths. Thin-film waveguides with high chromatic dispersion are fabricated using multilayer TiO2–SiO2 and ZrO2–SiO2 structures.

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Authors and Affiliations

  1. Belarusian-Russian University, 43 Mir Ave., Mogilev, 212000, Belarus

    V. Shulga & A. V. Khomchenko

Authors
  1. V. Shulga
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  2. A. V. Khomchenko
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Correspondence to V. Shulga.

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 80, No. 6, pp. 937–940, November–December, 2013.

An erratum to this article is available at http://dx.doi.org/10.1007/s10812-017-0416-4.

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Shulga, V., Khomchenko, A.V. Measurement of the Width of Emission Spectra by a Waveguide Technique. J Appl Spectrosc 80, 930–933 (2014). https://doi.org/10.1007/s10812-014-9867-z

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  • DOI: https://doi.org/10.1007/s10812-014-9867-z

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