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Light scattering by polystyrene films containing carbon nanoparticles

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Journal of Applied Spectroscopy Aims and scope

Laser (λ = 0.63 μm) Mueller polarimetry at different angles of incidence and detection is used to measure the elements of the Mueller matrices of polystyrene films, as well as of polystyrene films modified by adding carbon nanoparticles (fullerenes or nanotubes). The complex index of refraction, depolarization index, and polarizance (degree of polarization) of the test samples are determined. It is shown that adding even a small amount (1.0–3.5 mass %) of fullerenes or carbon nanotubes changes the depolarization properties of the modified polystyrene films. Depending on the illumination and observational geometry, these films are found to have different depolarization properties.

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Correspondence to A. Yu. Zhumar.

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 76, No. 5, pp. 740–745, September–October, 2009.

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Dlugunovich, V.A., Zhumar, A.Y., Tsaruk, O.V. et al. Light scattering by polystyrene films containing carbon nanoparticles. J Appl Spectrosc 76, 699–704 (2009). https://doi.org/10.1007/s10812-009-9247-2

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  • DOI: https://doi.org/10.1007/s10812-009-9247-2

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