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Measurements of the Temperature-Dependent Total Hemispherical Emissivity Using an Electrostatic Levitation Facility

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Abstract

Among the three fundamental processes of heat transfer (conduction, convection, and radiation), radiation is the most dominant at high temperatures. The total hemispherical emissivity is an important property that determines the amount of heat loss by radiation. Unfortunately, the emissivity, especially its temperature dependence \((\varepsilon (T))\), is unknown for most materials. Here, we demonstrate the feasibility of measuring \(\varepsilon (T)\) using an electrostatic levitation (ESL) technique that allows such measurements to be made on levitated solid and liquid samples in a contamination-free, high-vacuum environment. The \(\varepsilon (T)\) for solid Ni and liquid \(\hbox {Zr}_{60}\hbox {Al}_{10}\hbox {Cu}_{18}\hbox {Ni}_{9}\hbox {Co}_{3}\) from these measurements is consistent with the existing literature data.

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Acknowledgments

This work was partially supported by NASA under Grants NNX10AU19G and NNX16AB52G. Any opinions, finding, and conclusions or recommendations expressed in this manuscript are those of the author(s) and do not necessarily reflect the views of NASA. We would like to thank C. E. Pueblo for technical help.

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Authors and Affiliations

  1. Department of Physics, Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, MO, 63130, USA

    A. K. Gangopadhyay & K. F. Kelton

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  1. A. K. Gangopadhyay
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  2. K. F. Kelton
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Correspondence to A. K. Gangopadhyay.

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Gangopadhyay, A.K., Kelton, K.F. Measurements of the Temperature-Dependent Total Hemispherical Emissivity Using an Electrostatic Levitation Facility. Int J Thermophys 38, 3 (2017). https://doi.org/10.1007/s10765-016-2138-x

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