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A New Spectrophotometer System for Measuring Hemispherical Reflectance and Normal Emittance of Real Surfaces Simultaneously

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Abstract

A new spectrophotometer system is developed for the study of thermal radiation characteristics of real surfaces in thermal engineering environments. The system measures spectra of normal incidence hemispherical reflectance R NH and normal emittance \({\varepsilon _{\rm N}}\) in the near-ultraviolet through infrared region of wavelength of 0.30 μm to 11 μm simultaneously and repeatedly with a cycle time of 4 s. The system enables evaluation of the normal incidence absorptance A N in this wide spectral region. Transitions of spectra of specular-finished and rough-finished nickel surfaces in a high-temperature air-oxidation process are measured to demonstrate the performance of the system. Clear interference behaviors are found even in the spectra of hemispherical reflectance R NH and emittance \({\varepsilon _{\rm N}}\) of a rough-finished surface.

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Abbreviations

A N :

Normal incidence absorptance

n :

Index of refraction

R HH :

Hemispherical reflectance for hemispherically homogeneous incidence

R HN :

Normal reflectance for hemispherically homogeneous incidence

R NH :

Normal incidence hemispherical reflectance

R NN :

Normal incidence specular reflectance (specular reflection component of hemispherical reflectance R NH)

t :

Time after the start of heating specimen, s

T :

Temperature of specimen surface, K

\({\varepsilon _{\rm N}}\) :

Normal emittance

λ:

Wavelength of radiation in vacuum, m

σ :

Root-mean-square roughness, m

H:

Hemispherically homogeneous incidence, hemispherical reflection

N:

Normal (15° direction in measurement) incidence, reflection, and emission

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Authors and Affiliations

  1. Department of Mechanical Engineering and Science, Kyoto University, Kyoto, 606-8501, Japan

    Toshiro Makino & Hidenobu Wakabayashi

Authors
  1. Toshiro Makino
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  2. Hidenobu Wakabayashi
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Correspondence to Hidenobu Wakabayashi.

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Makino, T., Wakabayashi, H. A New Spectrophotometer System for Measuring Hemispherical Reflectance and Normal Emittance of Real Surfaces Simultaneously. Int J Thermophys 31, 2283–2294 (2010). https://doi.org/10.1007/s10765-010-0849-y

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  • DOI: https://doi.org/10.1007/s10765-010-0849-y

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