Abstract
Damage in a thin nickel film irradiated by subpicosecond pulses of terahertz (THz) radiation in the range of 1–3 THz at electric-field strengths up to 20 MV/cm at the center of a focal spot is observed. The damage threshold fluence is evaluated for single-pulse experiments. The damage pattern induced by multiple THz pulses has the appearance of a complex periodic structure in the form of elongated channels of metal film discontinuity that are perpendicular to the in-plane electric field direction of THz radiation.
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Acknowledgements
The experiments were performed using the unique scientific facility “Terawatt Femtosecond Laser Complex” in the “Femtosecond Laser Complex” Center of the Joint Institute for High Temperatures of the Russian Academy of Sciences.
Funding
This work is supported by Russian Science Foundation Grant No. 17-19-01261.
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V. Chefonov, O., V. Ovchinnikov, A., A. Evlashin, S. et al. Damage Threshold of Ni Thin Film by Terahertz Pulses. J Infrared Milli Terahz Waves 39, 1047–1054 (2018). https://doi.org/10.1007/s10762-018-0537-8
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DOI: https://doi.org/10.1007/s10762-018-0537-8