Abstract
By using a rigorous numerical technique that is applicable to calculation of modes in waveguides for the TE case, the effects of the periodic rectangular, triangular, sinusoidal and Gaussian random rough surface on the rectangular waveguide are discussed. The effects of the parameters of the roughness on the mode cutoff frequencies and field distribution are considered, including the height, width, and period of the grooves, the standard deviation of height and correlation length of the Gaussian roughness.
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C. D. Chen, C. k. C. Tzuang, and S. T. Peng, Full-wave analysis of a lossy rectangular waveguide containing rough inner surfaces, IEEE Microwave Guided Wave Lett 2, 180-181 (1992).
S. K. Popalghat, A. Chaudhari, and P. B. Patil, Effect of surface roughness on electromagnetic propagation through waveguides, Indian Journal of pure& Applied Physics 37, 848-852 (1999).
A. M. Sua´rez, R. E. Luna, J. C. Mandujano, and J. E. Luna, Numerical technique to calculate modes in waveguides of arbitrarily cross-sectional shape, J Opt Soc Am A 18, 961-965 (2001).
G. A. Rubioa, A. M. Sua´rez, R.E. Lunaa, and E. T. Herna´ndezb, Application of a new numerical method to calculate TE modes in hollow-conducting waveguides, Optical Communications 221, 301–306 (2003).
A. M. Sua´rez, U. R. Corona , and R. E. Luna, Effects of wall random roughness on TE and TM modes in a hollow conducting waveguide, Optical Communications 238, 291–299 (2004).
W. H. Press, S. A. Teukolsky, W.T. Vetterling, and B. P. Flannery, Numerical Recipes in FORTRAN, 2nd ed. (Cambridge University Press, Cambridge, UK, 1992).
Acknowledgments
This work was supported by basic research item of National Key Lab of Electronic Measurement Technology.
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Huang, B., Chen, J. & Jiang, W. Effects of Surface Roughness on TE Modes in Rectangular Waveguide. J Infrared Milli Terahz Waves 30, 717–726 (2009). https://doi.org/10.1007/s10762-009-9488-4
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DOI: https://doi.org/10.1007/s10762-009-9488-4