Abstract
A rigorous electromagnetic theory is developed to analyze multiport waveguide junctions with artificial inclusions formed of the conducting strips and dielectric layers. The method is based on the Fourier transform technique combined with the mode matching method technique that takes into account the edge conditions in vicinity of the strip edges. The scattering characteristics of a 3-port junction are discussed with the numerical examples for the SWR maps, the power reflection and transmission coefficients, and the 2D plots of near fields distributions inside the junction area. A strategy of optimize matching properties of the 3-port waveguide junctions is also presented.
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Bogdanov, F., Kevanishvili, G., Jandieri, G. et al. ANALYSIS AND DESIGN OF MULTIPORT WAVEGUIDE JUNCTIONS WITH ARTIFICIAL INCLUSIONS FORMED OF CONDUCTING STRIPS. Int J Infrared Milli Waves 27, 1347–1364 (2006). https://doi.org/10.1007/s10762-006-9142-3
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DOI: https://doi.org/10.1007/s10762-006-9142-3