Abstract
The new Penning trap mass spectrometer SMILETRAP II has been set up at the AlbaNova Research Center, Stockholm. Based on the former spectrometer SMILETRAP I, it uses the merits of highly-charged ions to achieve high precision in the mass measurements. Various improvements over the SMILETRAP I setup will allow to routinely perform mass measurements with relative uncertainties of 10 − 10 and below. In this paper we will discuss the limitations of SMILETRAP I and present the corresponding improvements of SMILETRAP II. An overview on the SMILETRAP II setup is given.
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Hobein, M., Solders, A., Liu, Y. et al. SMILETRAP II. Hyperfine Interact 199, 141–150 (2011). https://doi.org/10.1007/s10751-011-0308-6
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DOI: https://doi.org/10.1007/s10751-011-0308-6