Abstract
The changes in the electrical conductivity of thin films of cobalt, nickel, and praseodymium oxides in air and in media with a high concentration of ozone and argon are investigated. The surface morphology and the initial stages of formation of the films are analyzed. The samples prepared are examined using different physicochemical methods, such as X-ray powder diffraction and differential thermal analyses.
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REFERENCES
Perel'man, F.M., Zvorykina, A.Ya., and Rudina, P.V., Kobal't (Cobalt), Moscow: Akad. Nauk SSSR, 1949.
Lazarev, V.B., Krasov, V.G., and Shaplygin, I.S., Elektroprovodnost' okisnykh sistem i plenochnykh struktur (Electrical Conductivity of Oxide Systems and Film Structures), Moscow: Nauka, 1979.
Tret'yakov, Yu.D., Khimiya nestekhiometricheskikh okislov (Chemistry of Nonstoichiometric Oxides), Moscow: Moscow State University, 1974.
Semiconductors, Hannay, N., Ed., New York: Reinhold, 1959. Translated under the title Poluprovodniki, Moscow: Inostrannaya Literatura, 1962, p. 667.
Andreeva, A.F. and Gil'man, I.Ya., Some Properties of Films Prepared from Higher Oxides of Rare-Earth Elements through Reaction Evaporation, in Tugoplavkie soedineniya RZM (High-Melting Compounds of Rare-Earth Metals), Novosibirsk: Nauka, 1979, pp. 132–135.
Serebrennikov, V.V., Kozik, V.V., Sergeev, A.N., and Yakunina, G.M., Preparation, Properties, and Applications of Films Based on Rare-Earth Metal Oxides, in Tugoplavkie soedineniya RZM (High-Melting Compounds of Rare-Earth Metals), Novosibirsk: Nauka, 1979, pp. 117–120.
Kofstad, P., Nonstoichiometry: Diffusion and Electrical Conductivity in Binary Metal Oxides, New York: Wiley, 1972.
Kalinina, M.V., Moshnikov, V.A., Tikhonov, P.A., Tomaev, V.V., and Drozdova, I.A., Electron Microscopic Investigation of the Structure of Gas-Sensitive Nanocomposites Prepared by the Hydropyrolytic Method, Fiz. Khim. Stekla, 2003, vol. 29, no.3, pp. 450–456 [Glass Phys. Chem. (Engl. transl.), 2003, vol. 29, no. 3, pp. 322–327].
Kalinina, M.V., Moshnikov, V.A., Tikhonov, P.A., Tomaev, V.V., Nakusov, A.T., and Mikhailichenko, S.V., Materials for Resistive Gas-Sensitive Sensors and Electrodes in the Form of Microstructured and Nanostructured Films in the Systems Based on In2O3 and SnO2, in Trudy XIX Vserossiiskogo soveshchaniya po temperaturoustoichivym funktsional'nym pokrytiyam (Proceedings of the XIX All-Russia Conference on Temperature-Resistant Functional Coatings), St. Petersburg: Yanus, 2003, vol. 1, pp. 170–177.
Tikhonov, P.A., Nakusov, A.T., and Drozdova, I.A., Thin Films of Cadmium and Dysprosium Oxides as Gas-Sensitive Elements of Sensors, Fiz. Khim. Stekla, 2004, vol. 30, no.1, pp. 137–145 [Glass Phys. Chem. (Engl. transl.), 2004, vol. 30, no. 1, pp. 101–106].
Reed, S.J.B., Electron Microprobe Analysis, Cambridge (UK): Cambridge University Press, 1975. Translated under the title Elektronno-zondovyi mikroanaliz, Moscow: Mir, 1979.
Ormont, B.F., Vvedenie v fizicheskuyu khimiyu i kristallokhimiyu poluprovodnikov (Introduction to the Physical Chemistry and Crystal Chemistry of Semiconductors), Moscow: Vysshaya Shkola, 1979.
X-ray Diffraction Data Cards and Index, Philadelphia: American Society of Testing and Materials (ASTM).
Kalinina, M.V., Tikhonov, P.A., and Nakusov, A.T., Preparation, Electrical Conductivity, and Sensory Properties of Oxide Films in the In2O3-SnO2 and In2O3-ZrO2 Systems, Fiz. Khim. Stekla, 2003, vol. 29, no.6, pp. 862–869 [Glass Phys. Chem. (Engl. transl.), 2003, vol. 29, no. 6, pp. 626–631].
Petrov, V.V., On the Problem Concerning the Sensitivity of Semiconductor Chemical Sensors for Gases, Sensors, 2003, no. 1, pp. 48–49.
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Original Russian Text Copyright © 2005 by Fizika i Khimiya Stekla, Tikhonov, Nakusov, Drozdova, Kalinina, Domanskii.
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Tikhonov, P.A., Nakusov, A.T., Drozdova, I.A. et al. Investigation into the Sensory Properties of Fine-Grain Polycrystalline Films Based on Cobalt, Nickel, and Praseodymium Oxides. Glass Phys Chem 31, 700–708 (2005). https://doi.org/10.1007/s10720-005-0117-6
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DOI: https://doi.org/10.1007/s10720-005-0117-6