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Identification of RAPD and SCAR markers linked to northern leaf blight resistance in waxy corn (Zea mays var. ceratina)

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Abstract

Exserohilum turcicum causes northern corn leaf blight (NCLB), an important disease occurring in maize producing areas throughout the world. Currently, the development of cultivars resistant to E. turcicum seems to be the most efficient method to control NCLB damage. Marker-assisted selection (MAS) enables breeders to improve selection efficiency. The objective of this work was to identify random amplified polymorphic DNA (RAPD) and sequence characterized amplified region (SCAR) markers associated with NCLB resistance. Bulked segregant analysis (BSA) was used to search for RAPD markers linked to NCLB resistance genes, using F2 segregating population obtained by crossing a susceptible inbred ‘209W’ line with a resistant inbred ‘241W’ line. Two hundred and twenty-two decamer primers were screened to identify four RAPD markers: OPA07521, OPA16457, OPB09520, and OPE20536 linked to NCLB resistance phenotype. These markers were converted into dominant SCAR markers: SCA07496, SCA16420, SCB09464, and SCE20429, respectively. The RAPD and SCAR markers were developed successfully to identify NCLB resistant genotypes in segregating progenies carrying NCLB resistant traits. Thus, the markers identified in this study should be applicable for MAS for the NCLB resistance in waxy corn breeding programs.

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Acknowledgements

This research was partially funded by the Agricultural Biotechnology Project, Faculty of Agriculture, Khon Kaen University. J. Khampila would like to thank the University Staff Development Program, Mahasarakham University, Thailand for financial support of her PhD study. The authors wish to thank Prof. Jerald K. Pataky, Department of Crop Sciences, University of Illinois at Urbana-Champaign, USA for providing the NCLB severity standard cultivars for this study. We also thank N. Thoungnarin and C. Masingboon for their help in the field works.

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Authors and Affiliations

  1. Applied Taxonomic Research Center, Department of Biology, Faculty of Science, Khon Kaen University, Khon Kaen, 40002, Thailand

    Juthaporn Khampila, Nooduan Muangsan & Piyada Theerakulpisut

  2. Department of Plant Science and Agricultural Resources, Faculty of Agriculture, Khon Kaen University, Khon Kaen, 40002, Thailand

    Kamol Lertrat, Weerasak Saksirirat & Jirawat Sanitchon

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  1. Juthaporn Khampila
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  2. Kamol Lertrat
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  3. Weerasak Saksirirat
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  4. Jirawat Sanitchon
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  5. Nooduan Muangsan
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  6. Piyada Theerakulpisut
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Correspondence to Piyada Theerakulpisut.

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Khampila, J., Lertrat, K., Saksirirat, W. et al. Identification of RAPD and SCAR markers linked to northern leaf blight resistance in waxy corn (Zea mays var. ceratina). Euphytica 164, 615–625 (2008). https://doi.org/10.1007/s10681-008-9647-z

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