Testing relative to a nonrepeating alternative in a conjunction-disjunction basis is considered. A lower bound on the test length is established for all nonrepeating functions in this basis. A subsequence of easily testable functions is constructed and the corresponding tests are described. Individual lower test length bounds are proved for functions of a special form; minimality of the tests is established for the functions of the constructed subsequence.
Similar content being viewed by others
References
A. A. Voronenko, “On diagnostic tests for nonrepeating functions,” Matem. Voprosy Kibern., Fizmatlit, Moscow, No. 11, 163–176 (2002).
L. V. Ryabets, “Complexity of diagnostic tests for nonrepeating Boolean functions,” Diskretnaya Matematika i Informatika, No. 18, Irkutsk Gos. Ped. Univ., Irkutsk (2007).
A. A. Voronenko and D. V. Chistikov, “Individual testing of nonrepeating functions,” Uchenye Zapiski Kazan. Univ., Ser. Phys.-Math. Sci., 151, No. 2, 36–44 (2009).
A. A. Voronenko, “On the length of the diagnostic test for nonrepeating functions in the basis {0, 1, &, ∨, ¬} ,” Diskr. Matem., 17, No. 2, 139–143 (2005).
S. E. Bubnov, “Shannon function of the length of diagnostic tests for nonrepeating functions in an elementary basis,” Papers of Young Scientists of the MGU Faculty of Mathematics and Cybernetics [in Russian], MGU, MAKS Press, Moscow, No. 6, 47–57 (2009).
S. E. Bubnov, “Lower bound on the length of a diagnostic test for nonrepeating functions in the basis {&, ∨} ,” in: Discrete Models in Control System Theory: Proceedings of 8th International Conference (Moscow 6-9 April 2009), MGU, MAKS Press, Moscow (2009), pp. 40–43.
A. A. Voronenko, “Easily testable nonrepeating functions in the basis {&, ∨} ,” in: Discrete Models in Control System Theory: Proceedings of 8th International Conference (Moscow 6–9 April 2009), MGU, MAKS Press, Moscow (2009), pp. 52–54.
V. A. Gurvich, “On nonrepeating Boolean functions,” Usp. Mat. Nauk, 32, No. 1, 183–184 (1977).
V. N. Noskov, “Complexity of tests controlling the inputs of logic circuits,” Diskr. Analiz, Novosibirsk, No. 27, 23–51 (1975).
Author information
Authors and Affiliations
Corresponding author
Additional information
Translated from Prikladnaya Matematika i Informatika, No. 33, pp. 90–100, 2009.
Rights and permissions
About this article
Cite this article
Bubnov, S.E., Voronenko, A.A. & Chistikov, D.V. Some test length bounds for nonrepeating functions in the {&, ∨} basis. Comput Math Model 21, 196–205 (2010). https://doi.org/10.1007/s10598-010-9064-8
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10598-010-9064-8