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RBS and PIXE characterisation of Nd: KGW waveguiding films

  • Session 2: Nuclear Analytical Methods
  • Published:
Czechoslovak Journal of Physics Aims and scope

Abstract

Nd: KGd(WO4)2 thin films were deposited by KrF laser ablation on YAP and MgO substrates at substrate temperatures up to 800°C. Films stoichiometry (using RBS and PIXE) and waveguiding properties were studied in connection with deposition conditions. The RBS and PIXE measurements of the prepared samples are presented.

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Authors and Affiliations

  1. Nuclear Physics Institute, Academy of Sciences of the Czech Republic, CZ-250 68, Řež near Prague, Czech Republic

    A. Macková, V. Peřina & V. Havránek

  2. Institute of Physics, Academy of Sciences of the Czech Republic, CZ-182 21 Na Slovance 2, 8, Prague, Czech Republic

    M. Jelínek & J. Lančok

Authors
  1. A. Macková
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  2. V. Peřina
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  3. V. Havránek
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  4. M. Jelínek
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  5. J. Lančok
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Additional information

This work was supported by the project No. A1010110/01of Grant Agency ASCR and by project No. 102/01/D0069 of Grant Agency ASCR.

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Macková, A., Peřina, V., Havránek, V. et al. RBS and PIXE characterisation of Nd: KGW waveguiding films. Czech J Phys 53 (Suppl 1), A241–A246 (2003). https://doi.org/10.1007/s10582-003-0031-x

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  • DOI: https://doi.org/10.1007/s10582-003-0031-x

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