Abstract
NiO/Co and NiO/Ni80Fe20 bilayers were prepared at 293 K onto SiO2/Si(111) and glass substrates using UHV RF/DC magnetron sputtering. Results on ex-situ magnetic measurements showed that the unidirectional anisotropy field is inversely proportional to the Co (Ni80Fe20) layer thickness. A maximal RT coupling energy for the NiO−Co and NiO−Py interface was estimated as 0.04 and 0.03 mJ/m2, respectively, for the samples prepared onto SiO2/Si(111) substrates. The above behaviour is consistent with greater interface roughness and/or interdiffusion for the samples prepared onto glass substrates.
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Smardz, K., Smardz, L. Unidirectional anisotropy in NiO/Co and NiO/Ni80Fe20 layered structures. Czech J Phys 52 (Suppl 1), A173–A176 (2002). https://doi.org/10.1007/s10582-002-0041-0
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DOI: https://doi.org/10.1007/s10582-002-0041-0