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Thickness dependence of magnetic anisotropy and magnetoelastic constants in epitaxial Fe/GaAs (001) thin films

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Czechoslovak Journal of Physics Aims and scope

Abstract

The magnetic anisotropy and magnetoelastic properties in epitaxial iron films prepared by DC magnetron sputtering on single crystal GaAs (001) substrate and covered by a protective Si layer have been investigated by means of the ferromagnetic resonance (FMR), strain modulated ferromagnetic resonance (SMFMR) and magneto-optical Kerr effect (MOKE). It has been shown that the uniaxial and cubic anisotropy constants as well as two magnetoelastic constants strongly depend on the thickness of the film. The surface parts of the cubic anisotropy and magnetoelastic constants have been obtained.

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Authors and Affiliations

  1. Institute of Physics of the Polish Academy of Sciences, Al. Lotników 32/46, 02-668, Warsaw, Poland

    R. Zuberek, K. Fronc, A. Szewczyk, M. U. Gutowska & H. Szymczak

  2. Department of Physics and Astronomy, University of Sheffield, S3 7RH, Sheffield, UK

    M. R. J. Gibbs

Authors
  1. R. Zuberek
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  2. K. Fronc
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  3. A. Szewczyk
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  4. M. U. Gutowska
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  5. H. Szymczak
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  6. M. R. J. Gibbs
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Zuberek, R., Fronc, K., Szewczyk, A. et al. Thickness dependence of magnetic anisotropy and magnetoelastic constants in epitaxial Fe/GaAs (001) thin films. Czech J Phys 52 (Suppl 1), A169–A172 (2002). https://doi.org/10.1007/s10582-002-0040-1

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  • DOI: https://doi.org/10.1007/s10582-002-0040-1

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