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Properties of Hg cuprate thin films containing a mixture of Hg-1212 and Hg-1223 phases

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Czechoslovak Journal of Physics Aims and scope

Abstract

Hg based cuprate thin films of thickness 200 nm were prepared on various substrates (MgO, LaAlO3 and CeO2 buffered sapphire) by a two step procedure. Both, air stable Ba−Ca−Cu−(O,F) precursor films and Re doped (Hg,Re)−Ba−Ca−Cu−O pellets were used. The X-ray diffraction analyses and dc resistivity measurements indicate that the Hg cuprate films contain the majority HgBa2CaCu2O x (Hg-1212) and minority HgBa2Ca2Cu3O y (Hg-1223) phases. These films were investigated in a small magnetic field (<50 mT) to estimate the influence of weak links, between grains or between both phases, on the value of dc transport critical current.

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Authors and Affiliations

  1. Institute of Electrical Engineering, Slovak Academy of Sciences, 842 39, Bratislava, Slovak Republic

    V. Štrbík, Š. Chromik, P. Kleja & Š. Beňačka

  2. Laboratoire de Cristallographie-CNRS, 25 Av. Des Martyrs, Bp 166, F38042, Grenoble CEDEX09, France

    A. Sin

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  1. V. Štrbík
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  2. Š. Chromik
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  3. P. Kleja
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  4. Š. Beňačka
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  5. A. Sin
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Štrbík, V., Chromik, Š., Kleja, P. et al. Properties of Hg cuprate thin films containing a mixture of Hg-1212 and Hg-1223 phases. Czech J Phys 52 (Suppl 1), A161–A164 (2002). https://doi.org/10.1007/s10582-002-0038-8

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  • DOI: https://doi.org/10.1007/s10582-002-0038-8

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