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Angle Resolved TEM Imaging of Pt Nanoparticles

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Abstract

Particle shape and size are two of the most important characteristics of nanoparticulate catalysts that determined their activity and selectivity. In many studies, the shapes of nanoparticles are characterized using transmission electron micrographs obtained at a single nanoparticle orientation and thus, the shape determination is based on viewing a single cross-sectional profile of the nanoparticle. A full determination of particle shape should require viewing over a range of angles. In this work Pt nanoparticles with controlled shapes and sizes have been synthesized using a high pressure technique. Angle resolved transmission electron microscopy techniques (electron tomography) are necessary to view the crystals over a range of orientations and determine their three dimensional shapes. In this work, angle resolved TEM imaging of nanoparticles reveals information about the nanoparticle shape and orientation on substrates that cannot be determined from single cross-sectional TEM images. Angle resolved TEM imaging of nanoparticles will be very valuable in catalysis and in the fields where the shapes of nanoparticles play an important role.

Graphical Abstract

Angle resolved TEM imaging of Pt nanoparticles. TEM images taken at −2° rotation and +36° rotation. The encircled particle appears to be cubic and hexagonal at different rotations

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Acknowledgments

This technical effort was performed in support of the National Energy Technology Laboratory’s on-going research in “Next generation, sinter-resistant, catalysts for syngas conversion”, under the RDS contract DE-AC26-04NT41817.

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Authors and Affiliations

  1. National Energy Technology Laboratory, 626 Cochran Mill Road, Pittsburgh, PA, 15236, USA

    N. Shukla & A. J. Gellman

  2. Institute for Complex Engineered Systems, Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, 15213, USA

    N. Shukla

  3. Department of Chemical Engineering, Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, 15213, USA

    M. M. Nigra, M. A. Bartel & A. J. Gellman

  4. Department of Material Science and Engineering, Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, 15213, USA

    T. Nuhfer & C. Phatak

Authors
  1. N. Shukla
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  2. M. M. Nigra
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  3. M. A. Bartel
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  4. T. Nuhfer
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  5. C. Phatak
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  6. A. J. Gellman
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Correspondence to N. Shukla.

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Shukla, N., Nigra, M.M., Bartel, M.A. et al. Angle Resolved TEM Imaging of Pt Nanoparticles. Catal Lett 140, 85–89 (2010). https://doi.org/10.1007/s10562-010-0454-5

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  • DOI: https://doi.org/10.1007/s10562-010-0454-5

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