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Inclusion problems in trace monoids

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Abstract

Efficient pattern matching algorithms for traces and their dependence graphs are proposed. Pattern matching problems related to problems of recognizing frequent patterns in structured data and counting the number of trace object windows that include a pattern are considered.

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Authors and Affiliations

  1. Institute for Informatics and Automation Problems, National Academy of Science of the Republic of Armenia, Yerevan, Armenia

    K. V. Shahbazyan & Yu. H. Shoukourian

Authors
  1. K. V. Shahbazyan
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  2. Yu. H. Shoukourian
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Correspondence to K. V. Shahbazyan.

Additional information

Translated from Kibernetika i Sistemnyi Analiz, No. 4, pp. 31–38, July–August 2010.

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Shahbazyan, K.V., Shoukourian, Y.H. Inclusion problems in trace monoids. Cybern Syst Anal 46, 546–553 (2010). https://doi.org/10.1007/s10559-010-9231-0

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  • DOI: https://doi.org/10.1007/s10559-010-9231-0

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