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A low phase noise InGaP–GaAs HBT Colpitts VCO with a high quality differential inductor

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Abstract

A balanced Colpitts voltage controlled oscillator (VCO) topology with its two implementations in a GaAs heterojunction bipolar transistor (HBT) process is introduced in this paper. A detailed analysis of phase noise, originating from the work by Hajimiri and Lee, is given, which depicts a specific outline of the phase noise generation mechanisms in GaAs HBT based harmonic oscillators including LC cross coupled/Colpitts/class C VCOs. In addition, phase noise expressions for HBT based VCOs are derived, compared and act as an optimization tool in oscillator designs. The theoretical analysis of phase noise is authenticated with two balanced Colpitts VCOs with their respective center oscillation frequencies of 850 MHz and 1670 MHz, which are fabricated in a 2 µm GaAs HBT H20HL process. Measurement results show a phase noise of − 139 dBc/Hz at 1 MHz offset from an 850 MHz carrier and a phase noise of − 134 dBc/Hz or less at 1 MHz offset from a 1700 MHz carrier. The output power variation is less than 0.5 dBm over the tuning range. A relatively good match between numerical simulation and measurements is observed.

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Acknowledgements

Thanks to CDMG (Compact Device Modeling Group) group lead by Professor Jun Liu in Hangzhou Dianzi University for the valuable process assessment and modification work.

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Authors and Affiliations

  1. Microsystem and Terahertz Research Center, China Academy of Engineering Physics, Mianyang, China

    Xu Cheng, Feng-Jun Chen, Xinlin Xia & Xianjin Deng

  2. Insititute of Electronic Engineering, China Academy of Engineering Physics, Mianyang, China

    Xu Cheng, Feng-Jun Chen, Xinlin Xia & Xianjin Deng

  3. Key Laboratory for RF Circuits and Systems, Ministry of Education, Hangzhou Dianzi University, Hangzhou, China

    Haijun Gao

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  1. Xu Cheng
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Correspondence to Xu Cheng.

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Cheng, X., Gao, H., Chen, FJ. et al. A low phase noise InGaP–GaAs HBT Colpitts VCO with a high quality differential inductor. Analog Integr Circ Sig Process 100, 469–482 (2019). https://doi.org/10.1007/s10470-019-01426-w

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  • DOI: https://doi.org/10.1007/s10470-019-01426-w

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