Abstract
This paper presents an integration-leakage calibration technique for the switched-capacitor integrators in a delta-sigma modulator (DSM). Integrators realized with low-gain opamps are lossy. A DSM that uses lossy integrators exhibits a degraded signal-to-quantization-noise ratio. To calibrate an integrator, its integration leakage is detected in the digital domain, and the leakage compensation is applied to the same integrator in the analog domain. The proposed scheme can calibrate all integrators in a discrete-time DSM of any form. It can be proceed in the background without interrupting the normal DSM operation. The design considerations for the proposed calibration scheme are discussed. Design cases of a 1st-order, a 2nd-order, and a 3rd-order DSM are demonstrated and simulated.
Similar content being viewed by others
References
Young, I. A. (2010). Analog mixed-signal circuits in advanced nano-scale CMOS technology for microprocessors and SoCs. In: European Solid-State Circuits Conference (ESSCIRC), pp. 61–70.
Yoshizawa, H., Yabe, T., & Temes, G. C. (2011). High-precision switched-capacitor integrator using low-gain opamp. Electronics Letters, 47(5), 315.
Musah, T., & Moon, U. K. (2011). Correlated level shifting integrator with reduced sensitivity to amplifier gain. Electronics Letters, 47(2), 91.
Peng, X., Sansen, W., Hou, L., Wang, J., & Wu, W. (2011). Impedance adapting compensation for low-power multistage amplifiers. IEEE Journal of Solid-State Circuits, 46(2), 445–451.
Huang, H. & Lee, E. K. F. (2001). A 1.2 V direct background digital tuned continuous-time bandpass sigma-delta modulator. In: European Solid-State Circuits Conference (ESSCIRC), pp. 526–529.
Lu, C. Y., Silva-Rivas, J. F., Kode, P., Silva-Martinez, J., & Hoyos, S. (2010). A sixth-order 200 MHz IF bandpass sigma-delta modulator with over 68 dB SNDR in 10 MHz bandwidth. IEEE Journal of Solid-State Circuits, 45(6), 1122–1136.
Shu, Y. S., Song, B. S., Bacrania K. (2008). A 65 nm CMOS CT \(\Delta \Sigma\) modulator with 81 dB DR and 8 MHz BW auto-tuned by pulse injection. In: IEEE International Solid-State Circuits Conference (ISSCC) Digest of Technical Papers, pp. 500–631.
Duggal, A. R., Sonkusale, S., & Lachapelle, J. (2011). Calibration of delta-sigma data converters in synchronous demodulation sensing applications. IEEE Sensors Journal, 11(1), 16–22.
Lee, S. C., & Chiu, Y. (2014). A 15-Mhz bandwidth 1–0 MASH \(\Sigma \Delta\) ADC with nonlinear memory error calibration achieving 85-dBc SFDR. IEEE Journal of Solid-State Circuits, 49(3), 695–707.
Schreier, R. (1994). On the use of chaos to reduce idle-channel tones in delta-sigma modulators. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, 41(8), 539–547.
Zhang, Y., Chen, C. H., & Temes, G. C. (2013). Accuracy-enhanced switched-capacitor stages using low-gain opamps. Electronics Letters, 49(1), 22–23.
Huang, C. C., & Wu, J. T. (2005). A background comparator calibration technique for flash analog-to-digital converters. IEEE Transactions on Circuits and Systems I: Regular Papers, 52(9), 1732–1740.
Figueiredo, M., Santos-Tavares, R., Santin, E., Ferreira, J., Evans, G., & Goes, J. (2011). A two-stage fully differential inverter-based self-biased CMOS amplifier with high efficiency. IEEE Transactions on Circuits and Systems I: Regular Papers, 58(7), 1591–1603.
Wu, S. H., & Wu, J. T. (2013). A 81-dB dynamic range 16-Mhz bandwidth \(\Delta \Sigma\) modulator using background calibration. IEEE Journal of Solid-State Circuits, 48(9), 2170–2179.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Wu, SH., Wu, JT. Background calibration of integrator leakage in discrete-time delta-sigma modulators. Analog Integr Circ Sig Process 81, 645–655 (2014). https://doi.org/10.1007/s10470-014-0421-y
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10470-014-0421-y