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An accurate model for the thin film flow

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Abstract

This paper deals with the linear stability of a liquid film flowing down an inclined plane. The Navier–Stokes equations were reduced into four evolution equations that describe the development of the film depth, the flow rate, the free surface velocity, and the wall shear stress, using the Karman–Polhausen boundary layer integral method. Thus, we were able to determine the stability threshold and approach well the critical wave number for long waves. The obtained results were found to be in good agreement with the experiments of Liu et al.

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Authors and Affiliations

  1. Department of Mechanical and Industrial Engineering, Concordia University, 1455 de Maisonneuve Blvd, West Montreal, QC, H3G 1M8, Canada

    Hamid Ait Abderahmane & Georgios H. Vatistas

Authors
  1. Hamid Ait Abderahmane
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  2. Georgios H. Vatistas
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Correspondence to Hamid Ait Abderahmane.

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Ait Abderahmane, H., Vatistas, G.H. An accurate model for the thin film flow. Acta Mech Sin 24, 375–380 (2008). https://doi.org/10.1007/s10409-008-0149-y

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  • DOI: https://doi.org/10.1007/s10409-008-0149-y

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