Abstract:
The parallel plate resonator method has been used for measuring high quality (YBCO) thin films, which have low temperature residual losses comparable to those previously obtained in single crystals. The surface resistance and the real part of the conductivity show a non-monotonic behaviour with a broad peak around 45 K. The penetration depth and the real part of the conductivity vary linearly at low temperatures. The lowest penetration depth linear fitting has a slope value of to up to 20 K which is lower than previous measurements on YBCO single crystals. An interpretation of this smaller slope in terms of the generally accepted d-wave order parameter symmetry presents difficulties.
Similar content being viewed by others
Author information
Authors and Affiliations
Additional information
Received: 22 July 1997 / Revised: 11 March 1998 / Accepted: 23 June 1998
Rights and permissions
About this article
Cite this article
Farber, E., Deutscher, G., Contour, J. et al. Penetration depth measurement in high quality thin films. Eur. Phys. J. B 5, 159–162 (1998). https://doi.org/10.1007/s100510050429
Issue Date:
DOI: https://doi.org/10.1007/s100510050429