Scaling relationship between effective critical exponents throughout the crossover region in thin Ising films

Abstract:

The Monte Carlo (MC) approach is used to check the validity of the scaling relationship for the effective critical exponents in thin Ising films. We investigate this relationship not just in the critical region but throughout the crossover to the expected two-dimensional behavior. Our results indicate that this scaling relationship is very well-fulfilled throughout the entire crossover temperature region, as predicted by a previous renormalization group analysis. The two-dimensional universality class of Ising films is confirmed by means of data collapsing plots for plates with increasing L, up to L=100. The evolution of the maximum value of the effective critical exponents with film thickness is discussed.