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High-Resolution Reflectometry by Optical Multidigitized Coherence

  • OPTICAL SYSTEMS AND TECHNOLOGIES
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Abstract

We propose and confirm a novel technique of optical frequency domain reflectometry based on multidigitized coherence using a multimode laser. The proposed system can easily provide the potential for high resolution on the order of 10 μm without scanning frequencies as in frequency domain reflectometers of either continuous or stepwise sweep. The theoretical approach agrees well with the experimental results demonstrated using a commercially available multimode laser diode.

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Author notes

  1. Naoki Anndo

    Present address: NEC Corporation, Tokyo, 108-01, Japan

  2. Yoshiki Odagiri

    Present address: Yamagata NEC Corporation, Yamagata, 990, Japan

Authors and Affiliations

  1. Department of Electronics and Information Engineering, Yamagata University, Yonezawa, 992, Japan

    Tsutomu Ichimura, Naoki Anndo, Tadayuki Funaba, Shigeru Endo, Yoshiki Odagiri & Naohiro Tan-no

  2. Department of Electronics, Tohoku Institute of Technology, 35-1 Yagiyama-kasumichou, Taihaku-ku, Sendai, 982 Japan and Biophotonics Information Laboratories, 683 Kurumanomae, Ohaza Numagi, Yamagata, 990, Japan

    Humio Inaba

Authors
  1. Tsutomu Ichimura
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  2. Naoki Anndo
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  3. Tadayuki Funaba
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  4. Shigeru Endo
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  5. Yoshiki Odagiri
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  6. Naohiro Tan-no
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  7. Humio Inaba
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Ichimura, T., Anndo, N., Funaba, T. et al. High-Resolution Reflectometry by Optical Multidigitized Coherence. OPT REV 3, 38–46 (1996). https://doi.org/10.1007/s10043-996-0038-1

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  • DOI: https://doi.org/10.1007/s10043-996-0038-1

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