Abstract
Temporal phase unwrapping based on phase-encoding is a technique widely used in 3D measurement for its high-speed advantage. However, eliminating fringe order jump error induced by the system’s luminance nonlinearity is still a key challenge. We propose a fringe order jump error self-correction method to address this issue. First, we encode the shifting phase and stair phase separately and combine them into the same pattern based on four-step phase shifting. This allows us to calculate the fringe order and wrapped phase simultaneously and avoid the overlapping of two set phases. Then, we add auxiliary patterns to obtain information on the order-located period’s odd-evenness characteristic. Theoretically, we demonstrate that under the influence of the nonlinear effect, the order calculation value for a particular period fluctuates between the ideal values of two adjacent orders. Thus, the correct order value can be directly determined by acquiring the period characteristic information, without the need for complex error compensation. Simulations demonstrate that the method performs good robustness where random noise and luminance saturation exist simultaneously in addition to system nonlinearity. Our experiments confirm the effectiveness of this method for high-accurate and fast fringe order determination.
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig1_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig2_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig3_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig4_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig5_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig6_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig7_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig8_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig9_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig10_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig11_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig12_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig13_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig14_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig15_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig16_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10043-023-00825-9/MediaObjects/10043_2023_825_Fig17_HTML.png)
Similar content being viewed by others
Data availability
Data underlying the results presented in this study are not publicly available at this time but may be obtained from the authors upon reasonable request.
References
Xu, J., Zhang, S.: Status, challenges, and future perspectives of fringe projection profilometry. Opt. Lasers Eng. 135, 106193 (2020)
Liang, R.: Short wavelength and polarized phase shifting fringe projection imaging of translucent objects. Opt. Eng. 53, 014104 (2014)
Gorthi, S.S., Rastogi, P.: Fringe projection techniques: Whither we are? Opt. Lasers Eng. 48, 133–140 (2010)
Jeong, M.S., Kim, S.W.: Color grating projection moire with time-integral fringe capturing for high-speed 3-D imaging. Opt. Eng. 41, 1912–1917 (2002)
Song, L., Dong, X., Xi, J., Yu, Y., Yang, C.: A new phase unwrapping algorithm based on Three Wavelength Phase Shift Profilometry method. Opt. Laser Technol. 45, 319–329 (2013)
Zuo, C., Huang, L., Zhang, M., Chen, Q., Asundi, A.: Temporal phase unwrapping algorithms for fringe projection profilometry: A comparative review. Opt. Lasers Eng. 85, 84–103 (2016)
Zuo, C., Feng, S., Huang, L., Tao, T., Yin, W., Chen, Q.: Phase shifting algorithms for fringe projection profilometry: A review. Opt. Lasers Eng. 109, 23–59 (2018)
Yang, F., He, X.: Two-step phase-shifting fringe projection profilometry: intensity derivative approach. Appl. Optics 46, 7172–7178 (2007)
Chen, X., Wu, J., Fan, R., Liu, Q., Xiao, Y., Wang, Y., Wang, Y.: Two-Digit Phase-Coding Strategy for Fringe Projection Profilometry. IEEE Trans. Instrum. Meas. 70, 7001309 (2021)
He, X., Kemao, Q.: A comparison of n-ary simple code and n-ary gray code phase unwrapping in high-speed fringe projection profilometry. Opt. Lasers Eng. 128, 106046 (2020)
Li, E.B., Peng, X., Xi, J., Chicharo, J.F., Yao, J.Q., Zhang, D.W.: Multi-frequency and multiple phase-shift sinusoidal fringe projection for 3D profilometry. Opt. Express 13, 1561–1569 (2005)
Zhu, H., Guo, H.: Alternate Iterative Least-Squares Algorithm Based on Nonuniform Phase Shifting for Suppressing Nonlinearity Errors in Fringe Projection Profilometry. IEEE Trans. Instrum. Meas. 71, 1–13 (2022)
Yu, X., Lai, S., Liu, Y., Chen, W., Xue, J., Zhang, Q.: Generic nonlinear error compensation algorithm for phase measuring profilometry. Chin. Opt. Lett. 19, 101201 (2021)
Luo, J., Wang, Y., Yang, X., Chen, X., Wu, Z.: Modified five-step phase-shift algorithm for 3D profile measurement. Optik 162, 237–243 (2018)
Wu, G., Wu, Y., Li, L., Liu, F.: High-resolution few-pattern method for 3D optical measurement. Opt. Lett. 44, 3602–3605 (2019)
Shiyang, T., Yanjun, F., Jiannan, G., Baiheng, M., Zhanjun, Y.: A novel fast 3D measurement method based on phase-coded fringe projection. Opt. Rev. 29, 215–224 (2022)
Zou, Z., Zhu, Y., Qin, G., Wang, D.: Three-dimensional shape measurement method based on composite cyclic phase coding. Appl. Optics 62, 246–254 (2023)
Ma, M., Yao, P., Deng, J., Deng, H., Zhang, J., Zhong, X.: A morphology phase unwrapping method with one code grating. Rev. Sci. Instrum. 89, 073112 (2018)
Wu, J., Zhou, Z., Liu, Q., Wang, Y., Wang, Y., Gu, Y., Chen, X.: Two-wavelength phase-shifting method with four patterns for three-dimensional shape measurement. Opt. Eng. 59, 024107 (2020)
Chen, X., Wang, Y., Wang, Y., Ma, M., Zeng, C.: Quantized phase coding and connected region labeling for absolute phase retrieval. Opt. Express 24, 28613–28624 (2016)
Xing, S., Guo, H.: Directly recognizing and removing the projector nonlinearity errors from a phase map in phase-shifting fringe projection profilometry. Opt. Commun. 435, 212–220 (2019)
Xing, S., Guo, H.: Correction of projector nonlinearity in multi-frequency phase-shifting fringe projection profilometry. Opt. Express 26, 16277–16291 (2018)
Hoang, T., Pan, B., Nguyen, D., Wang, Z.: Generic gamma correction for accuracy enhancement in fringe-projection profilometry. Opt. Lett. 35, 1992–1994 (2010)
Wang, Y., Zhang, S.: Novel phase-coding method for absolute phase retrieval. Opt. Lett. 37, 2067–2069 (2012)
Jiang, C., Xing, S., Guo, H.: Fringe harmonics elimination in multi-frequency phase-shifting fringe projection profilometry. Opt. Express 28, 2838–2856 (2020)
Pan, B., Kemao, Q., Huang, L., Asundil, A.: Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry. Opt. Lett. 34, 416–418 (2009)
Ri, S., Wang, Q., Xia, P., Tsuda, H.: Spatiotemporal phase-shifting method for accurate phase analysis of fringe pattern. J. Opt. 21, 095702 (2019)
Yao, J., Xiong, C., Zhou, Y., Miao, H., Chen, J.: Phase error elimination considering gamma nonlinearity, system vibration, and noise for fringe projection profilometry. Opt. Eng. 53, 094102 (2014)
Liu, K., Wang, Y., Lau, D. L., Hao, Q., Hassebrook, L. G.: Gamma model and its analysis for phase measuring profilometry. J. Opt. Soc. Am. A-Opt. Image Sci. Vis. 27, 553–562 (2010)
Funding
The Joint Funds of the National Natural Science Foundation of China (No. 51975374).
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
Conflict of interest
The authors declare no conflicts of interest.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Wu, ZB., Tao, W., Lv, N. et al. Self-correction of fringe order jump error induced by system nonlinearity based on phase-coding method. Opt Rev 30, 436–453 (2023). https://doi.org/10.1007/s10043-023-00825-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10043-023-00825-9