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Two-exposure quasi-common-path point diffraction interferometric phase microscopy using a four-step algorithm

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Abstract

A two-exposure nearly common-path point diffraction interferometric phase microscopy (IPM) is presented using polarization modulation and one-step grating shifting to implement quantitative phase imaging. The IPM is constructed by an improved Michelson configuration with a reflective grating, and its frequency spectrum generated by a circularly polarized object beam makes double copies through a beam splitter. One copy is low-pass filtered and reflected by a reflective pinhole mirror to create a reference beam, and the other copy is converted by a polarizer and then reflected by a reflective grating to achieve a 45° linearly polarized object beam. By the combination of a polarizing cube beam splitter with 45° tilted angle and a translation of the reflective grating with a π phase shift, four interferograms with π/2 phase shift can be obtained in two exposures. The standard four-step algorithm can then be used to reconstruct the phase of the specimen. The utility of the proposed method was demonstrated with measurements on a phase plate, cells and an oil drop.

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Acknowledgements

This study was supported by the National Natural Science Foundation of China (61377009, 61775046); Major National Scientific Instrument and Equipment Development Project of China (2013YQ290489).

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Correspondence to Mingguang Shan.

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Bai, H., Shan, M., Zhong, Z. et al. Two-exposure quasi-common-path point diffraction interferometric phase microscopy using a four-step algorithm. Opt Rev 25, 102–108 (2018). https://doi.org/10.1007/s10043-017-0399-7

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  • DOI: https://doi.org/10.1007/s10043-017-0399-7

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