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Incident-angle-dependent reflectance in distributed Bragg reflectors fabricated from ZnO/MgO multilayer films

  • Special Section: The 9th International Conference on Optics-photonics Design & Fabrication “ODF’14, Itabashi, Tokyo”
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Abstract

We present the incident-angle-dependent reflectance spectra of the 10-period ZnO/MgO multilayer films deposited on Si by sputtering technique. As increasing the incident angle, the resonant wavelength and bandwidth of the measured reflectance spectra exhibit redshift and narrower, respectively. The theoretical curves using transfer matrix method taken account of transverse electric (TE) and transverse magnetic (TM) polarizations are calculated to well describe the variations in the behavior of the experimental spectra. The simulated TE- and TM-reflection band at different angles can evaluate the bandwidth of the resonance band and provide valuable parameters to design an omnidirectional-reflection band in selected multilayer structure.

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Authors and Affiliations

  1. Department of Electrical Engineering, National Taiwan Ocean University, Keelung, 20224, Taiwan

    Ying-Shin Huang, Chung-Cheng Chang, Zin-Kuan Wun & Kwong-Kau Tiong

  2. Department of Digital Technology Design, Tungfang Design University, Hunei, Kaohsiung, 82941, Taiwan

    Sheng-Yao Hu

  3. Department of Electronic Engineering, Tungnan University, Shenkeng, New Taipei City, 22202, Taiwan

    Chia-Chih Huang & Yueh-Chien Lee

  4. Department of Materials Engineering, Ming Chi University of Technology, Taishan, New Taipei City, 24301, Taiwan

    Jyh-Wei Lee

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  1. Ying-Shin Huang
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  2. Sheng-Yao Hu
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  3. Chia-Chih Huang
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  7. Zin-Kuan Wun
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Correspondence to Yueh-Chien Lee.

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Huang, YS., Hu, SY., Huang, CC. et al. Incident-angle-dependent reflectance in distributed Bragg reflectors fabricated from ZnO/MgO multilayer films. OPT REV 21, 651–654 (2014). https://doi.org/10.1007/s10043-014-0104-z

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  • DOI: https://doi.org/10.1007/s10043-014-0104-z

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