Application of piecewise linear regression twice to inspect the defective regions on thin film transistor liquid crystal display panels

Abstract

Detecting defects in thin film transistor liquid crystal display (TFT-LCD) panels can be difficult due to non-uniform background brightness and slightly different brightness levels between the defective regions and the background. One well-known method is to inspect the defects of TFT-LCD panels using the polynomial approximation method. However, there are some problems such as determination of the polynomial degree and ghost objects. In this paper, to overcome these problems, we propose a new algorithm using the piecewise linear regression twice and Niblack’s method which do not require to determine the polynomial degree for the approximation. Our algorithm effectively removed ghost objects. The experimental results show that our proposed method performed well and was good enough to substitute the polynomial approximation method.