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Introduction of TTCN-3 into the product development process: considerations from an electronic devices developer point of view

  • Special section on advances in test automation – the evolution of TTCN-3
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Abstract

Following the successful standardisation of TTCN-3, several attempts were made to introduce the language into the product development process to improve the related testing activities. For several years appreciation was moderate. Reasons are to be found in the structure of existing testing procedures and problems of interoperability in early TTCN-3 products. Testing and development environments typical for electronic devices manufacturing are outlined and it is shown where in the process future benefits through further formalisation of test definition and implementations may be found.

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References

  1. MTS:The Testing and Test Control Notation, Version 3; Part 1: TTCN-3 Core Language, ETSI ES 201 873-1

  2. Deiß, T., Nyberg, A.J., Schulz, S., Willcock, C., Teittinen, R.: Industrial deployment of the TTCN-3 testing technology. IEEE Softw. J. 23(4), 48–54 (2006)

    Article  Google Scholar 

  3. MTS: The Testing and Test Control Notation, Version 3; Part 5: TTCN-3 Runtime Interface (TRI), ETSI ES 201 873-5

  4. MTS: The Testing and Test Control Notation Version 3; Part 6: TTCN-3 Control Interface (TCI), ETSI ES 201 873-6

  5. Deiß T.: Refactoring and converting a TTCN-2 test suite. Int. J. Softw. Tools Technol. Transf.(this issue)

  6. Nyberg, A.J.: Use of TTCN-3 for software module testing. Lecture Notes on Computer Science (LNCS).In: Proceedings of the 18th IFIP International Conference on Testing Communicating Systems (TestCom 2006). Springer, New York (2006)

  7. The D-MINT project on the Web: http://www.d-mint.org

  8. Raffelt, H., Steffen, B., Berg, T.: LearnLib: a library for automata learning and experimentation. In: Proceedings of the 10th International Workshop on Formal Methods for Industrial Critical Systems, Lisbon, Portugal. ACM Press, New York (2005)

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Authors and Affiliations

  1. Nokia Research Center, Meesmannstraße 103, 44807, Bochum, Germany

    Martin Botteck & Thomas Deiß

Authors
  1. Martin Botteck
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  2. Thomas Deiß
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Correspondence to Martin Botteck.

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Botteck, M., Deiß, T. Introduction of TTCN-3 into the product development process: considerations from an electronic devices developer point of view. Int J Softw Tools Technol Transf 10, 285–289 (2008). https://doi.org/10.1007/s10009-008-0077-y

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  • DOI: https://doi.org/10.1007/s10009-008-0077-y

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