Abstract
The present work examined the gas evolution on a solid-state sintered silicon carbide material (EKasic®D) at high anodic potentials (up to 120 V vs Ag/AgCl). By using the amperometric detection as well as the method of oxygen quenching, the part of anodic evolved oxygen could be determined for 75–95% of the total amount of consumed charge. The minor part of the total charge is consumed by oxide film formation (passive range) or material dissolution (transpassive range).
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Schneider, M., Šimůnková, L., Junker, N. et al. Quantitative detection of anodic oxygen evolution on solid state sintered silicon carbide under near ECM conditions. J Solid State Electrochem 24, 207–215 (2020). https://doi.org/10.1007/s10008-019-04479-z
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DOI: https://doi.org/10.1007/s10008-019-04479-z