Abstract
Pure and doped vanadium pentoxide (V2O5, V2O5/MoO3) thin films were prepared by sol-gel method and dip coating technique. Furthermore, they were characterized by chronocoulometry, cyclic voltammetry (CV), UV-Vis, atomic force microscopy (AFM), X-ray diffraction (XRD), and perfilometry. The best results were obtained with V2O5/MoO3 5 mol% film, which showed highest ion storage capacity of ~92 mC cm−2 when compared to other films. Moreover, this film showed optical modulation of 40% at 633 nm after coloration and bleaching for 60 s. XRD patterns revealed that the film has orthorhombic crystalline structure; AFM and perfilometry confirmed roughness and thickness of 4.38 and 554 nm, respectively.
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The authors are indebted to FAPERGS (grant 12/2239-9), CNPq (grant 201820/2014-5), Statoil, and Capes for the financial support given to this research.
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Cholant, C.M., Westphal, T.M., Balboni, R.D.C. et al. Thin films of V2O5/MoO3 and their applications in electrochromism. J Solid State Electrochem 21, 1509–1515 (2017). https://doi.org/10.1007/s10008-016-3491-1
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DOI: https://doi.org/10.1007/s10008-016-3491-1