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Full-field analysis and image forces for piezoelectric bimaterials

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Summary

In this study, the two-dimensional explicit full-field solutions of transversely isotropic piezoelectric bimaterials subjected to mechanical and electrical loads are derived by using the Fourier-transform technique. The major objective of this study is to analyze the physical meaning and the structure of the solution. One of the novel features is that Green’s functions for bimaterials consist of Green’s functions for the infinite plane. The complete solutions of this problem include Green’s function of originally applied singularities in an infinite medium and nine image singularities which are induced to satisfy interface continuity conditions. It is shown that the physical meaning of the solution is the image method. The mathematical method used in this study provides an automatic determination for the locations of image singularities. The locations of image singularities are dependent on the roots of the characteristic equation for bimaterials. According to the characteristic roots, the number and distribution for image singularities are discussed in detail. The expressions for image forces acting on edge dislocations are given explicitly with the aid of the generalized Peach–Koehler formula. Numerical results for the full-field distributions of stresses, electric fields in bimaterials and image forces for edge dislocations are presented.

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Authors and Affiliations

  1. Department of Mechanical Engineering, National Taiwan University, Taipei, 10617, Taiwan, ROC

    Chien-Ching Ma, W.-C. Wu & J.-M. Lee

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  1. Chien-Ching Ma
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  2. W.-C. Wu
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  3. J.-M. Lee
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Correspondence to Chien-Ching Ma.

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Dedicated to Professor Franz Ziegler on the occasion of his 70th birthday

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Ma, CC., Wu, WC. & Lee, JM. Full-field analysis and image forces for piezoelectric bimaterials. Acta Mech 195, 275–294 (2008). https://doi.org/10.1007/s00707-007-0543-8

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  • DOI: https://doi.org/10.1007/s00707-007-0543-8

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