Scattering of SH-waves by an interface cavity

Summary.

The scattering of the SH-wave and dynamic stress concentrations near an arbitrary cavity situated at the planar interface separating two different elastic media are investigated. The total wave field can be obtained by superposition of the free field and the scattered field. The free field is composed of the incident, reflected and refracted waves. The scattered wave fields in adjacent media are expressed respectively, and the method of wave functions expansion is applied to obtain the solutions for these fields. The scattered wave functions can be expanded into Hankel-Fourier series with unknown coefficients. In solving for the unknown coefficients according to the boundary conditions for the total wave field at the interface and at the cavity wall, the non-orthogonality makes the system of equations for the unknown coefficients infinite and coupling each other. Another key point is to extend each scattered wave field from its own half-plane domain into the full plane domain by a certain way keeping the total wave field unchanged for the non-orthogonal Fourier integrals around the cavity. Finally, the scattering of the SH wave by an interface ellipse with different ratios between long and short axis is considered, and the distributions of dynamic stress concentration factors at the cavity wall are presented.