Skip to main content
SpringerLink
Log in

Analysis of pure copper – a comparison of analytical methods

  • Original Paper
  • Published:
Microchimica Acta Aims and scope Submit manuscript

Abstract.

The reliability and performance of various analytical methods for the determination of 22 trace elements in pure copper is compared and discussed. The work was performed in the framework of an interlaboratory comparison for the preparation of four pure copper reference materials with graded element mass fractions of Ag, Al, As, Bi, Cd, Co, Cr, Fe, Mg, Mn, Ni, P, Pb, S, Sb, Se, Si, Sn, Te, Ti, Zn, and Zr. Special analytical results (ET-AAS, ICP-MS) obtained by the authors were described in more detail and were compared to the certified values. Special regard was paid to the influence of the copper matrix on performance and sensitivity of each analytical method and to the dissolution procedure of copper matrix and interferences from insoluble residues. For a generalized evaluation of the figures of merit for each applied elemental analytical method results from several independent laboratories were included in the discussion.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  • S P Murarka S W Hymes (1995) ArticleTitleCopper metallization for ULSI and beyond Cr Rev Sol State 20 87 Occurrence Handle10.1080/10408439508243732 Occurrence Handle1:CAS:528:DyaK2MXmtFKqtbo%3D

    Article  CAS  Google Scholar 

  • P Singer (2002) ArticleTitleProgress in copper: a look ahead Semiconductor Int 25 46 Occurrence Handle1:CAS:528:DC%2BD38XktV2kur8%3D

    CAS  Google Scholar 

  • ISO (2006) Reference materials – general and statistical principles for certification. ISO Guide 35

  • ASTM (1990) Standard practise for testing homogeneity of materials for development of reference material. ASTM E 826

  • BAM (1997) Guidelines for the production and certification of BAM reference materials. BAM, Berlin

  • Lange B, Recknagel S, Richter S (2006) Certification report BAM-M381 – 384. Certificates. BAM, Berlin, http://www.bam.de/pdf/service/referenzmaterialien/certificate.pdf

  • Z B Alfassi C M Wai (1992) Preconcentration Techniques for Trace Elements CRC Boca Raton, Florida USA

    Google Scholar 

  • S A Kumar M B Sanglikar M S Shaikh M Sudersanan (2004) ArticleTitleRole of matrix material in the characterization of high-purity copper by flame and graphite furnace AAS Indian J Chem Techn 11 170 Occurrence Handle1:CAS:528:DC%2BD2cXjs1yjtL8%3D

    CAS  Google Scholar 

  • B Welz (Eds) (1997) Atomabsorptionsspektrometrie Wiley-VCH Weinheim New York Chicester Toronto Brisbane Singapore

    Google Scholar 

  • E Milella E Sentimenti G Mazzetto (1993) ArticleTitleAnalysis of impurities in high-purity copper by zeeman graphite furnace AAS At Spectrosc 14 1 Occurrence Handle1:CAS:528:DyaK3sXis1Gltr4%3D

    CAS  Google Scholar 

  • E DIN 32645:2006-09, DIN Deutsches Institut für Normung e.V.

  • Nehm R (2005) Elementverunreinigungen in konzentrierten Kupferlösungen bestimmen. Labor Praxis Juli/August:54

  • R Matschat M Czerwensky (1997) ArticleTitleTrace analysis of selected high-purity metals using high-resolution inductively coupled plasma mass spectrometry and inductively coupled plasma optical emission spectrometry Phys Stat Sol (a) 160 567 Occurrence Handle10.1002/1521-396X(199704)160:2<567::AID-PSSA567>3.0.CO;2-8 Occurrence Handle1:CAS:528:DyaK2sXjtFOqtrg%3D

    Article  CAS  Google Scholar 

  • R Matschat M Czerwensky M Hamester S Pattberg (1997) ArticleTitleInvestigations concerning the analysis of high-purity metals (Cd, Cu, Ga and Zn) by high resolution inductively coupled plasma mass spectrometry Fresen J Anal Chem 359 418 Occurrence Handle10.1007/s002160050601 Occurrence Handle1:CAS:528:DyaK2sXmvVOnsrs%3D

    Article  CAS  Google Scholar 

  • H Emteborg X Tian FC Adams (1999) ArticleTitleQuality assurance of arsenic, lead, tin and zinc in copper alloys using axial inductively coupled plasma time-of-flight mass spectrometry (ICP-TOF-MS) J Anal At Spectrom 14 1567 Occurrence Handle10.1039/a904208c Occurrence Handle1:CAS:528:DyaK1MXmtVyns78%3D

    Article  CAS  Google Scholar 

  • S Pattberg R Matschat (1999) ArticleTitleDetermination of trace impurities in high purity copper using sector-field ICP-MS: continuous nebulization, flow injection analysis and laser ablation Fresen J Anal Chem 364 410 Occurrence Handle10.1007/s002160051358 Occurrence Handle1:CAS:528:DyaK1MXksFaktbg%3D

    Article  CAS  Google Scholar 

  • Pattberg S (1999) Multielement-spurenbestimmung in Reinstkupfer mit HR-ICP-MS. Dissertation, Humboldt Universität, Berlin

  • H P Weise W Görner M Hedrich (2001) ArticleTitleDetermination of elements by nuclear analytical methods Fresen J Anal Chem 369 8 Occurrence Handle10.1007/s002160000626 Occurrence Handle1:CAS:528:DC%2BD3MXit1Smug%3D%3D

    Article  CAS  Google Scholar 

  • G Wermann (2000) Neutronentransmutationsdotierung von Reinstkupfermaterialien zur Herstellung von abgestuften Zinkgehalten im unteren µg/g-Bereich Mensch&Buch Berlin

    Google Scholar 

  • K H Ecker U Wätjen A Berger L Persson W Pritzkow M Radtke H Riesemeier (2002) ArticleTitleRBS, SY-XRF, INAA and ICP-IDMS of antimony implanted in silicon – a multi-method approach to characterize and certify a reference material Nucl Instrum Methods 188 120 Occurrence Handle10.1016/S0168-583X(01)01038-2 Occurrence Handle1:CAS:528:DC%2BD38XisV2msLw%3D

    Article  CAS  Google Scholar 

  • H Riesemeier K Ecker W Görner B R Müller M Radtke M Krumrey (2005) ArticleTitleLayout and first XRF applications of the BAMLine at BESSY II X-Ray Spectrom 34 160 Occurrence Handle10.1002/xrs.750 Occurrence Handle1:CAS:528:DC%2BD2MXitFyhsLw%3D

    Article  CAS  Google Scholar 

  • R Simon G Buth M Hagelstein (2003) ArticleTitleThe X-ray-fluorescence facility at ANKA, Karlsruhe: minimum detection limits and micro probe capabilities Nucl Instrum Methods 199 554 Occurrence Handle10.1016/S0168-583X(02)01418-0 Occurrence Handle1:CAS:528:DC%2BD3sXltVylsw%3D%3D

    Article  CAS  Google Scholar 

  • M Steffen (2002) ArticleTitleAnalysis of Copper – possibilities and limits Erzmetall 55 366 Occurrence Handle1:CAS:528:DC%2BD38XnsFyrur4%3D

    CAS  Google Scholar 

  • W E Publicover (1965) ArticleTitleSpectrochmical analysis of oxygen-free electrolytically pure copper by a globule arc procedure Anal Chem 37 1680 Occurrence Handle10.1021/ac60232a012 Occurrence Handle1:CAS:528:DyaF28XjtVylsA%3D%3D

    Article  CAS  Google Scholar 

  • K Slickers (1992) Die automatische Atom-Emissions-Spektralanalyse Buchvertrieb K.A. Slickers Gießen

    Google Scholar 

  • M Kasik C Venzago R Dorka (2003) ArticleTitleQuantification in trace and ultratrace analyses using glow discharge techniques: round robin test on pure copper materials J Anal At Spectrom 18 603 Occurrence Handle10.1039/b300025g Occurrence Handle1:CAS:528:DC%2BD3sXkt1emtLc%3D

    Article  CAS  Google Scholar 

  • R Matschat J Hinrichs H Kipphardt (2006) ArticleTitleApplication of glow discharge mass spectrometry to multielement ultra-trace determination in ultrahigh-purity copper and iron: a calibration approach achieving quantification and traceability Anal Bioanal Chem 386 125 Occurrence Handle10.1007/s00216-006-0645-5 Occurrence Handle1:CAS:528:DC%2BD28Xotl2msrs%3D

    Article  CAS  Google Scholar 

  • H Traub M Czerwensky R Matschat H Kipphardt (2006) Comparison of different calibration strategies for the analysis of pure copper by LA-ICP-MS UHPM Berlin, Germany

    Google Scholar 

  • J S Becker H J Dietze (2003) ArticleTitleState-of-the-art in inorganic mass spectrometry for analysis of high-purity materials Int J Mass Spec 228 127 Occurrence Handle10.1016/S1387-3806(03)00270-7 Occurrence Handle1:CAS:528:DC%2BD3sXlvVWmsr8%3D

    Article  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Analytical Chemistry, Reference Materials, Federal Institute for Materials Research and Testing (BAM), Berlin, Germany

    Britta Lange, Sebastian Recknagel, Michael Czerwensky, Ralf Matschat, Matthias Michaelis, Burkhard Peplinski & Ulrich Panne

Authors
  1. Britta Lange
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Sebastian Recknagel
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Michael Czerwensky
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Ralf Matschat
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Matthias Michaelis
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. Burkhard Peplinski
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. Ulrich Panne
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Britta Lange.

Additional information

Correspondence: Britta Lange, Department of Analytical Chemistry, Reference Materials, Federal Institute for Materials Research and Testing (BAM), Richard-Willstaetter-Str. 11, D-12489 Berlin, Germany

Rights and permissions

Reprints and permissions

About this article

Cite this article

Lange, B., Recknagel, S., Czerwensky, M. et al. Analysis of pure copper – a comparison of analytical methods. Microchim Acta 160, 97–107 (2008). https://doi.org/10.1007/s00604-007-0849-1

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s00604-007-0849-1

Search

Navigation