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New position error signal generation method for SPM based data storage system

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Abstract

A new position error signal (PES) generation method for scanning probe microscope (SPM) based Data Storage (SDS) system is proposed. In this paper, instead of pits used by the conventional methods, two stripe patterns (sync and PES patterns) are used. The two patterns can be either etched or nano imprinted for mass production. In the proposed method analog-to-digital converters are no longer needed. Instead, a simple digital counter and phase locked loop logic along with analog comparators are used. We present how to construct PES, and investigate its quality degradation due to manufacturing uncertainties such as misalignment during assembly process and scanning speed jitters. Simulation and experimental results with PES quality analysis were presented to confirm the validity of the proposed patterns.

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Acknowledgments

This work was supported by the Korea Science and Engineering Foundation (KOSEF) grant funded by the Korea government (MEST) (No. 2009-0079576). This work was also supported in part by the Korea government (MKE) through the program for the Development of the Next Generation Ultra-High Density Storage. This work was also supported in part by the Research Fund of HYU (HYU-2008-T).

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Authors and Affiliations

  1. Division of Electrical and Computer Engineering, Hanyang University, Seoul, 133-791, Republic of Korea

    Choong Woo Lee

  2. Department of Electrical Engineering, Hanyang University, Seoul, 133-791, Republic of Korea

    Hyun Jae Kang & Chung Choo Chung

  3. Devices and Materials Laboratory, LG Electronics Institute of Technology, Seoul, 137-724, Republic of Korea

    Young-Sik Kim

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  1. Choong Woo Lee
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  2. Hyun Jae Kang
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  3. Chung Choo Chung
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  4. Young-Sik Kim
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Correspondence to Chung Choo Chung.

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Lee, C.W., Kang, H.J., Chung, C.C. et al. New position error signal generation method for SPM based data storage system. Microsyst Technol 15, 1663–1674 (2009). https://doi.org/10.1007/s00542-009-0868-4

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  • DOI: https://doi.org/10.1007/s00542-009-0868-4

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