Abstract
The main cause of irrational results from measurements made with optical stylus instruments is speckle noise in the reflected light. To reduce or eliminate speckle noise, we developed a new optical stylus profiling system consisting of a displacement measuring part using a knife-edge and a speckle noise measurement part. Using this new system, we measured profiles of machined materials. The results show that the new system can eliminate speckle noise and can achieve a level of measurement accuracy as high as that of a contact stylus instrument.
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Fukatsu, H., Yanagi, K. Development of an optical stylus displacement sensor for surface profiling instruments. Microsyst Technol 11, 582–589 (2005). https://doi.org/10.1007/s00542-005-0558-9
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DOI: https://doi.org/10.1007/s00542-005-0558-9