Soft Computing

, Volume 22, Issue 13, pp 4197–4203 | Cite as

Automatic image thresholding using Otsu’s method and entropy weighting scheme for surface defect detection

  • Mai Thanh Nhat Truong
  • Sanghoon Kim


Defect detection is one of the most important tasks and a challenging problem for industrial quality control. Among the available visual inspection techniques, automatic thresholding is a commonly used approach for defect detection because of the simplicity in terms of its implementation and computing. In this paper, we propose an automatic thresholding technique, which is an improvement in Otsu’s method, using an entropy weighting scheme. The proposed method enables the detection of extremely small defect regions compared to the product surface area. Experimental results confirm the efficiency of the proposed system over other techniques.


Automatic thresholding Nondestructive testing Defect detection Entropy 



This study was funded by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2015R1D1A1A01057518).

Compliance with ethical standards

Conflict of interest

The authors declare that they have no conflict of interest.

Ethical approval

This article does not contain any studies with human participants or animals performed by any of the authors.


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Copyright information

© Springer-Verlag GmbH Germany 2017

Authors and Affiliations

  1. 1.Department of Electrical, Electronics, and Control EngineeringHankyong National UniversityAnseong-siRepublic of Korea

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