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Surface morphology and chemistry of Prunus laurocerasus L. leaves: a study using X-ray photoelectron spectroscopy, time-of-flight secondary-ion mass spectrometry, atomic-force microscopy and scanning-electron microscopy

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Abstract

The surface properties of the plant cuticle play a crucial role in plant–pathogen interactions and the retention and penetration of agriculturally important chemicals. This paper describes the use of X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (ToF-SIMS), tapping-mode atomic force microscopy (TM-AFM) and scanning electron microscopy (SEM) to determine surface-specific chemical and material properties of the adaxial surface of Prunus laurocerasus L. leaves. XPS data, derived from the uppermost few nanometres (<10 nm) of the leaf surface, were consistent with the wax components and functionality known to be present within the waxes. ToF-SIMS provided molecular speciation from the outermost monolayer of the leaf surface, indicating the importance of a family of acetates with chain lengths ranging from C20 to C34. The presence of alkanes with C29 and C31 chain lengths was also confirmed. SEM and TM-AFM topography images revealed a textured granular surface, while simultaneously recorded AFM phase images revealed heterogeneous material properties at the nanoscale. The relevance of these data to plant cuticle development, allelochemistry and agrochemical delivery is discussed.

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Abbreviations

AFM :

Atomic force microscopy

A–P–D :

Amplitude–phase–distance

BE :

Binding energy

CW :

Cuticular wax

EW :

Epicuticular wax

FE-SEM :

Field-emission scanning electron microscopy

SEM :

Scanning electron microscopy

TM-AFM :

Tapping-mode atomic force microscopy

ToF-SIMS :

Time-of-flight secondary-ion mass spectrometry

UHV :

Ultra high vacuum

XPS :

X-ray photoelectron spectroscopy

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Acknowledgements

The authors thank Syngenta Ltd. and The University of Nottingham for funding a studentship for M. Perkins. We also thank Emily Smith for assistance with the XPS data and Frank Rutten for the ToF-SIMS data.

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Authors and Affiliations

  1. Laboratory of Biophysics and Surface Analysis, The School of Pharmacy, The University of Nottingham, University Park, Nottingham, NG7 2RD, UK

    Mark C. Perkins, Clive J. Roberts & Martyn C. Davies

  2. Centre for Surface Chemical Analysis, The University of Nottingham, University Park, Nottingham, NG7 2RD, UK

    David Briggs

  3. Syngenta, Jealotts Hill International Research Centre, Bracknell, Berkshire, RG42 6EY, UK

    Adrian Friedmann, Clifford A. Hart & Gordon A. Bell

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  1. Mark C. Perkins
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  2. Clive J. Roberts
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Correspondence to Clive J. Roberts.

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Perkins, M.C., Roberts, C.J., Briggs, D. et al. Surface morphology and chemistry of Prunus laurocerasus L. leaves: a study using X-ray photoelectron spectroscopy, time-of-flight secondary-ion mass spectrometry, atomic-force microscopy and scanning-electron microscopy. Planta 221, 123–134 (2005). https://doi.org/10.1007/s00425-004-1417-0

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