Abstract
The surface morphology of thin polymer blend films of deuterated polystyrene (dPS) and polyparamethylstyrene (PpMS) is investigated with scanning force microscopy (SFM) and optical microscopy. From a statistical analysis of the data the most prominent in-plane length picturing the domain size as a function of the blend film thickness is determined. In ultra-thin films surface patterns directly after preparation are absent, whereas for thicker films a linear dependence is observed. After a relaxation towards equilibrium, resulting from annealing or storage under toluene vapor, the power law observed changes for ultra-thin films and remains unchanged for thicker films.
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Received: 27 July 2000 Accepted: 30 October 2000
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Müller-Buschbaum, P., Stamm, M. Film thickness dependence of the domain size in weakly incompatible thin polymer blend films. Colloid Polym Sci 279, 376–381 (2001). https://doi.org/10.1007/s003960000456
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DOI: https://doi.org/10.1007/s003960000456