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The final stage of droplet evaporation on black silicon by schlieren technique with a graded filter

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Abstract

A reflectance-schlieren technique, enhanced by the stepped gradient filter, is applied for accurate measurements of the map of thin liquid film/droplet thicknesses and surface deformations, allowing measuring angles of surface inclination in the range of \([- 5^{\circ }, 5^{\circ }]\). In the present paper, we investigated the final stage of droplet evaporation of non-volatile water and volatile perfectly wetting liquids FC-72 and HFE-7100. Thin liquid film thickness down to 2 \(\upmu\)m has been measured by using black silicon substrate (b-Si), which has low reflectivity and high absorption of visible light. The substrate is heated in the temperature range from 20 to 50 \(^{\circ }\)C. The liquid bump occurrence in the periphery of the non-volatile droplet, the thin liquid film breakup, and ring formation are characterized. The droplet fragmentation into picolitre-sized pieces is observed for volatile low surface tension liquids. The specific evaporation rate is confirmed to increase proportionally to the contact line velocity. The adopted schlieren technique is also found to be applicable for observations from above of the bubble dynamics inside a liquid film and for measurements of the receding contact angles.

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Data availability

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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Acknowledgements

This study was supported by the Russian Science Foundation (Project No. 20-19-00722).

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Authors and Affiliations

  1. Kutateladze Institue of Thermophysics SB RAS, 1 Lavrentyev Ave., Novosibirsk, Russia, 630090

    Yulia A. Peschenyuk, Andrey A. Semenov & Elizaveta Ya. Gatapova

  2. Novosibirsk State University, 2 Pirogov Str., Novosibirsk, Russia, 630090

    Yulia A. Peschenyuk, Andrey A. Semenov & Elizaveta Ya. Gatapova

  3. National Polytechnic University of Armenia, 610101, Yerevan, Armenia

    Gagik Y. Ayvazyan

Authors
  1. Yulia A. Peschenyuk
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  2. Andrey A. Semenov
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  3. Gagik Y. Ayvazyan
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  4. Elizaveta Ya. Gatapova
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Contributions

EYG conceptualized the research and methodology. GYA performed black silicon preparation. AAS, YAP performed experiments. YAP performed data curation and developed software. EYG supervised, validated, interpreted results and wrote the manuscript. All authors reviewed the manuscript.

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Correspondence to Elizaveta Ya. Gatapova.

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Peschenyuk, Y.A., Semenov, A.A., Ayvazyan, G.Y. et al. The final stage of droplet evaporation on black silicon by schlieren technique with a graded filter. Exp Fluids 64, 1 (2023). https://doi.org/10.1007/s00348-022-03541-3

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