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Near-surface velocimetry using evanescent wave illumination

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Abstract

Total internal reflection velocimetry (TIRV) is used to measure particle motion in the near-wall region of a microfluidic system. TIRV images are illuminated with the evanescent field of an incident laser pulse and contain only particles that are very close to the channel surface. Sub-micron-sized fluorescent particles suspended in water are used as seed particles and their images are analyzed with a particle tracking velocimetry (PTV) algorithm to extract information about apparent slip velocity. At relatively low shear rates (less than 2,500 s-1), a velocity proportional to the shear rate was observed. The statistical difference between velocities measured over hydrophilic and hydrophobic surfaces was found to be minimal. The results suggest that the slip length, if present, is less than 10 nm, but uncertainty regarding the exact character of the illumination field prevents a more accurate measurement at this time. Numerical simulations are presented to help understand the results and to provide insight into the mechanisms that result in the experimentally observed distributions. Issues associated with the accuracy of the experimental technique and the interpretations of the experimental results are also discussed.

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Acknowledgement

The authors would like to thank Thomas Powers for his discussion on issues regarding the simulation of Brownian motion in shear flow; Min-Jun Kim for assistance in channel fabrication, and the rest of the Brown University Microfluidics Lab for their support. Two authors (SJ and JYY) acknowledge support from the Brain Korea 21 Project and the Micro Thermal System Research Center, Seoul National University.

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Authors and Affiliations

  1. Division of Engineering, Brown University, Providence, Rhode Island, 02912, USA

    P. Huang & K. S. Breuer

  2. School of Mechanical and Aerospace Engineering, Seoul National University, Seoul, 151-742, Korea

    S. Jin & J. Y. Yoo

  3. Division of Mechanical Engineering, Ajou University, Gyeonggi, 443-749, Korea

    J. Park

Authors
  1. S. Jin
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  2. P. Huang
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  3. J. Park
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  4. J. Y. Yoo
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  5. K. S. Breuer
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Corresponding author

Correspondence to K. S. Breuer.

Additional information

A version of this paper was presented at the 5th international symposium on particle image velocimetry (PIV 2003), Busan, Korea, 22–24 September 2003.

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Jin, S., Huang, P., Park, J. et al. Near-surface velocimetry using evanescent wave illumination. Exp Fluids 37, 825–833 (2004). https://doi.org/10.1007/s00348-004-0870-7

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  • DOI: https://doi.org/10.1007/s00348-004-0870-7

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