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Coherence artifacts in second harmonic microscopy

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We present an analysis of these effects and demonstrate a simple, yet powerful technique to eliminate these coherence artifacts. The technique relies on a superposition of the signal field with a coherent auxiliary SH-field of controllable phase and amplitude and allows a direct observation of the true χ(2)-morphology of the interface.

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Authors and Affiliations

  1. Technische Universität Wien, Inst. 359 – Abteilung Quantenelektronik und Lasertechnik, Gusshausstr. 27/359-4, A-1040 Vienna, Austria (E-mail: reider@tuwien.ac.at), , , , , , AT

    G.A. Reider, M. Cernusca & M. Hofer

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  1. G.A. Reider
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  2. M. Cernusca
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  3. M. Hofer
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Recieved: 20 September 1998

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Reider, G., Cernusca, M. & Hofer, M. Coherence artifacts in second harmonic microscopy . Appl Phys B 68, 343–347 (1999). https://doi.org/10.1007/s003400050629

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  • DOI: https://doi.org/10.1007/s003400050629

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